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Title: An Anti‐Ambipolar Cryo‐Phototransistor
Abstract

Novel anti‐ambipolar transistors (AATs) are gate tunable rectifiers with a marked potential for multi‐valued logic circuits. In this work, the optoelectronic applications of AATs in cryogenic conditions are studied, of which the AAT devices consist of vertically stackedp‐SnS andn‐MoSe2nanoflakes to form a type‐II staggered band alignment. An electrostatically tunable p‐SnS/n‐MoSe2cryo‐phototransistor is presented with unique anti‐ambipolar characteristics and cryogenic‐enhanced optoelectronic performance. The cryo‐phototransistor exhibits a sharp and highly symmetric anti‐ambipolar transfer curve at 77 K with the peak‐to‐valley ratio of 103operating under a low bias voltage of 1 V. The high cooling‐enhanced charge mobilities in the cryo‐phototransistor grant this AAT device remarkable photodetection capabilities. At 77 K, thep‐SnS/n‐MoSe2cryo‐phototransistor, holding a broad photoresponse in the spectral range of 250−900 nm, demonstrates its high responsivity of 2 × 104 A W−1and detectivity of 7.5 × 1013 Jones with the excitation at 532 nm. The high‐performancep‐SnS/n‐MoSe2low‐dimensional phototransistor with low operating voltages at 77−150 K is eligible for optoelectronic applications in cryogenic environments. Furthermore, the cryo‐characteristics of this heterostructure can be further extended to design the mul‐tivalued logic circuits operated in cryogenic conditions.

 
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NSF-PAR ID:
10416420
Author(s) / Creator(s):
 ;  ;  ;  ;  ;  
Publisher / Repository:
Wiley Blackwell (John Wiley & Sons)
Date Published:
Journal Name:
Advanced Electronic Materials
Volume:
9
Issue:
8
ISSN:
2199-160X
Format(s):
Medium: X
Sponsoring Org:
National Science Foundation
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    Acknowledgment

    This work was partially supported by the U.S. National Science Foundation (NSF) Award No. ECCS-1931088. S.L. and H.W.S. acknowledge the support from the Improvement of Measurement Standards and Technology for Mechanical Metrology (Grant No. 22011044) by KRISS.

    Figure 1

     

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