Gong, X., Polsin, D. N., Paul, R., Henderson, B. J., Eggert, J. H., Coppari, F., Smith, R. F., Rygg, J. R., and Collins, G. W. X-Ray Diffraction of Ramp-Compressed Silicon to 390 GPa. Retrieved from https://par.nsf.gov/biblio/10422025. Physical Review Letters 130.7 Web. doi:10.1103/PhysRevLett.130.076101.

Gong, X., Polsin, D. N., Paul, R., Henderson, B. J., Eggert, J. H., Coppari, F., Smith, R. F., Rygg, J. R., & Collins, G. W. X-Ray Diffraction of Ramp-Compressed Silicon to 390 GPa. Physical Review Letters, 130 (7). Retrieved from https://par.nsf.gov/biblio/10422025. https://doi.org/10.1103/PhysRevLett.130.076101

Gong, X., Polsin, D. N., Paul, R., Henderson, B. J., Eggert, J. H., Coppari, F., Smith, R. F., Rygg, J. R., and Collins, G. W. "X-Ray Diffraction of Ramp-Compressed Silicon to 390 GPa". Physical Review Letters 130 (7). Country unknown/Code not available. https://doi.org/10.1103/PhysRevLett.130.076101. https://par.nsf.gov/biblio/10422025.

@article{osti_10422025,
place = {Country unknown/Code not available}, title = {X-Ray Diffraction of Ramp-Compressed Silicon to 390 GPa}, url = {https://par.nsf.gov/biblio/10422025}, DOI = {10.1103/PhysRevLett.130.076101}, abstractNote = {}, journal = {Physical Review Letters}, volume = {130}, number = {7}, author = {Gong, X. and Polsin, D. N. and Paul, R. and Henderson, B. J. and Eggert, J. H. and Coppari, F. and Smith, R. F. and Rygg, J. R. and Collins, G. W.}, }