Architectural Radiation Hardening of CMOS Power Management Circuits through Bias Tuning
- Award ID(s):
- 1910380
- PAR ID:
- 10432857
- Date Published:
- Journal Name:
- 2023 IEEE 41st VLSI Test Symposium (VTS)
- Volume:
- 1
- Issue:
- 1
- Page Range / eLocation ID:
- 1 to 8
- Format(s):
- Medium: X
- Sponsoring Org:
- National Science Foundation
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