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Title: Storage-Based Logic Built-In Self-Test with Variable-Length Test Data
Award ID(s):
2041649
PAR ID:
10466710
Author(s) / Creator(s):
Publisher / Repository:
IEEE
Date Published:
ISBN:
978-1-6654-5938-9
Page Range / eLocation ID:
1 to 6
Format(s):
Medium: X
Location:
Austin, TX, USA
Sponsoring Org:
National Science Foundation
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