skip to main content
US FlagAn official website of the United States government
dot gov icon
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
https lock icon
Secure .gov websites use HTTPS
A lock ( lock ) or https:// means you've safely connected to the .gov website. Share sensitive information only on official, secure websites.

Explore Research Products in the PAR
It may take a few hours for recently added research products to appear in PAR search results.


Title: Test Compaction by Test Removal Under Transparent Scan
Award ID(s):
1714147
PAR ID:
10099051
Author(s) / Creator(s):
Date Published:
Journal Name:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Volume:
27
Issue:
2
ISSN:
1063-8210
Page Range / eLocation ID:
496 to 500
Format(s):
Medium: X
Sponsoring Org:
National Science Foundation
More Like this
  1. ; ; (, ACM)
  2. ; ; (, Arnold Mathematical Journal)
  3. ; ; ; (, ACM)
  4. ; (, IEEE Transactions on Reliability)
  5. (, IEEE)
  • Citation Formats
  • MLA
  • APA
  • Chicago
  • BibTeX
  • Save / Share this Record
  • Send to Email