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Abstract Interfacial thermal resistance plays a crucial role in efficient heat dissipation in modern electronic devices. It is critical to understand the interfacial thermal transport from both experiments and underlying physics. This review is focused on the transient opto-thermal Raman-based techniques for measuring the interfacial thermal resistance between 2D materials and substrate. This transient idea eliminates the use of laser absorption and absolute temperature rise data, therefore provides some of the highest level measurement accuracy and physics understanding. Physical concepts and perspectives are given for the time-domain differential Raman (TD-Raman), frequency-resolved Raman (FR-Raman), energy transport state-resolved Raman (ET-Raman), frequency domain ET-Raman (FET-Raman), as well as laser flash Raman and dual-wavelength laser flash Raman techniques. The thermal nonequilibrium between optical and acoustic phonons, as well as hot carrier diffusion must be considered for extremely small domain characterization of interfacial thermal resistance. To have a better understanding of phonon transport across material interfaces, we introduce a new concept termed effective interface energy transmission velocity. It is very striking that many reported interfaces have an almost constant energy transmission velocity over a wide temperature range. This physics consideration is inspired by the thermal reffusivity theory, which is effective for analyzing structure-phonon scattering. We expect the effective interface energy transmission velocity to give an intrinsic picture of the transmission of energy carriers, unaltered by the influence of their capacity to carry heat.
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Quantifying noise effects in optical measures of excited state transport
Time-resolved microscopy is a widely used approach for imaging and quantifying charge and energy transport in functional materials. While it is generally recognized that resolving small diffusion lengths is limited by measurement noise, the impacts of noise have not been systematically assessed or quantified. This article reports modeling efforts to elucidate the impact of noise on optical probes of transport. Excited state population distributions, modeled as Gaussians with additive white noise typical of experimental conditions, are subject to decay and diffusive evolution. Using a conventional composite least-squares fitting algorithm, the resulting diffusion constant estimates are compared with the model input parameter. The results show that heteroscedasticity (i.e., time-varying noise levels), insufficient spatial and/or temporal resolution, and small diffusion lengths relative to the magnitude of noise lead to a surprising degree of imprecision under moderate experimental parameters. Moreover, the compounding influence of low initial contrast and small diffusion length leads to systematic overestimation of diffusion coefficients. Each of these issues is quantitatively analyzed herein, and experimental approaches to mitigate them are proposed. General guidelines for experimentalists to rapidly assess measurement precision are provided, as is an open-source tool for customizable evaluation of noise effects on time-resolved microscopy transport measurements.
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- Award ID(s):
- 2154448
- PAR ID:
- 10496922
- Publisher / Repository:
- AIP Publishing
- Date Published:
- Journal Name:
- The Journal of Chemical Physics
- Volume:
- 160
- Issue:
- 12
- ISSN:
- 0021-9606
- Format(s):
- Medium: X
- Sponsoring Org:
- National Science Foundation
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- Free Publicly Accessible Full Text
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Accepted Manuscript1.0
- Journal Article:
- https://doi.org/10.1063/5.0190347
