Abstract Linear regression is a classic method of data analysis. In recent years, sketching—a method of dimension reduction using random sampling, random projections or both—has gained popularity as an effective computational approximation when the number of observations greatly exceeds the number of variables. In this paper, we address the following question: how does sketching affect the statistical properties of the solution and key quantities derived from it? To answer this question, we present a projector-based approach to sketched linear regression that is exact and that requires minimal assumptions on the sketching matrix. Therefore, downstream analyses hold exactly and generally for all sketching schemes. Additionally, a projector-based approach enables derivation of key quantities from classic linear regression that account for the combined model- and algorithm-induced uncertainties. We demonstrate the usefulness of a projector-based approach in quantifying and enabling insight on excess uncertainties and bias-variance decompositions for sketched linear regression. Finally, we demonstrate how the insights from our projector-based analyses can be used to produce practical sketching diagnostics to aid the design of judicious sketching schemes.
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An Improved Analysis and Unified Perspective on Deterministic and Randomized Low-Rank Matrix Approximation
We introduce a Generalized LU Factorization (GLU) for low-rank matrix approximation.
We relate this to past approaches and extensively analyze its approximation properties.
The established deterministic guarantees are combined with sketching ensembles satisfying Johnson--
Lindenstrauss properties to present complete bounds. Particularly good performance is shown for
the subsampled randomized Hadamard transform (SRHT) ensemble. Moreover, the factorization is
shown to unify and generalize many past algorithms, sometimes providing strictly better approximations.
It also helps to explain the effect of sketching on the growth factor during Gaussian
elimination.
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- Award ID(s):
- 2004763
- NSF-PAR ID:
- 10511313
- Publisher / Repository:
- SIAM
- Date Published:
- Journal Name:
- SIAM Journal on Matrix Analysis and Applications
- Volume:
- 44
- Issue:
- 2
- ISSN:
- 0895-4798
- Page Range / eLocation ID:
- 559 to 591
- Format(s):
- Medium: X
- Sponsoring Org:
- National Science Foundation
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