skip to main content
US FlagAn official website of the United States government
dot gov icon
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
https lock icon
Secure .gov websites use HTTPS
A lock ( lock ) or https:// means you've safely connected to the .gov website. Share sensitive information only on official, secure websites.


Title: Far-field far-subwavelength spatial resolution using relative motion with structured illumination
Relative motion of structured optical illumination with respect to an object and far-field measurement of intensity are presented as a means to obtain far-subwavelength spatial resolution with a direct imaging arrangement. The principle behind this approach is that the variable interaction of an object with a background field generates information about nanometer-scale features that is encoded in the propagating plane wave spectrum, allowing far-field data that is modulated with motion according to the nanostructure. Information theory supports this new super-resolution mechanism and illustrates sensitivity with respect to the illumination and detection arrangements. Simulations indicate that available lasers and detectors would enable a resolution of lambda/1000 with modest signal-to-noise requirements and single-pixel detection. Relative motion in structured fields is shown to enhance spatial resolution achievable using data inversion with constraints. Importantly, far-subwavelength sensitivity is shown to be achievable even when the illuminating field is unknown. These results suggest applications that include material defect detection and unlabeled protein sensing, and direct extensions to estimating geometrical features at unprecedented spatial resolution become possible.  more » « less
Award ID(s):
1909660 2131486
PAR ID:
10518026
Author(s) / Creator(s):
; ; ;
Publisher / Repository:
Physical Review A
Date Published:
Journal Name:
Physical Review A
Volume:
109
Issue:
2
ISSN:
2469-9926
Page Range / eLocation ID:
023509
Format(s):
Medium: X
Sponsoring Org:
National Science Foundation
More Like this
  1. Super-resolution optical sensing is of critical importance in science and technology and has required prior information about an imaging system or obtrusive near-field probing. Additionally, coherent imaging and sensing in heavily scattering media such as biological tissue has been challenging, and practical approaches have either been restricted to measuring the field transmission of a single point source, or to where the medium is thin. We present the concept of far-subwavelength spatial sensing with relative object motion in speckle as a means to coherently sense through heavy scatter. Experimental results demonstrate the ability to distinguish nominally identical objects with nanometer-scale translation while hidden in randomly scattering media, without the need for precise or known location and with imprecise replacement. The theory and supportive illustrations presented provide the basis for super-resolution sensing and the possibility of virtually unlimited spatial resolution, including through thick, heavily scattering media with relative motion of an object in a structured field. This work provides enabling opportunities for material inspection, security, and biological sensing. 
    more » « less
  2. A randomly scattering analyzer with a multi-element fixed detector aperture located in the far field is introduced as a means to access enhanced spatial sensing information associated with far-subwavelength spatial features. This sensing method allows far-subwavelength spatial resolution with coherent fields scattered from a moving object, or some other relative change that causes a modified field incident on the detector aperture. Experimental optical speckle correlation data with a translated diffusing structure show the salient features, and understanding in relation to the experimental variables is supported by numerical simulations. The conclusion is that more-heavily-scattering analyzers provide better spatial resolution because the measurements are more sensitive to changes in the incident field. Such randomly scattering analyzers offer a new dimension for sensitive coherent optical metrology related to various sensing and motion application domains requiring large offset distances. 
    more » « less
  3. We present a general theory for optical imaging of moving objects obscured by heavily scattering random media. Measurements involve collecting a series of speckle intensity images as a function of the position of a moving object. A statistical average intensity correlation can be formed with the potential to provide access to microscopic and macroscopic information about the object. For macroscopic objects and translation distances that are both large relative to the wavelength, there is a clear method to invert measurements to form an image of the hidden object. Opportunities exist for super-resolution sensing and imaging, with far-subwavelength resolution. Importantly, there is no fundamental limit to the thickness of the background randomly scattering medium, other than the practical requirement of detecting an adequate number of photons and sufficient background scatter for developed Gaussian field statistics. The approach can be generalized to any wave type and frequency, under the assumption that there is adequate temporal coherence. Applications include deep tissue in vivo imaging and sensing in and through various forms of environmental clutter. The theory also provides another dimension for intensity interferometry and entangled state detection to the case with motion of the scatterer or emitter. 
    more » « less
  4. null (Ed.)
    Far-field analysis of small objects is severely constrained by the diffraction limit. Existing tools achieving sub-diffraction resolution often utilize point-by-point image reconstruction via scanning or labelling. Here, we present a new technique capable of fast and accurate characterization of two-dimensional structures with at least wavelength/25 theoretical resolution, based on a single far-field intensity measurement. Experimentally, we realized this technique resolving the smallest-available to us 180-nm-scale features with 845-nm laser light, reaching a resolution of wavelength/5. A comprehensive analysis of machine learning algorithms was performed to gain insight into the learning process and to understand the flow of subwavelength information through the system. Image parameterization, suitable for diffractive configurations and highly tolerant to random noise was developed. The proposed technique can be applied to new optical characterization tools with high spatial resolution, fast data acquisition and artificial intelligence, such as high-speed nanoscale metrology and quality control, and can be further developed to high-resolution spectroscopy 
    more » « less
  5. Light-sheet microscopes must compromise among field of view, optical sectioning, resolution, and detection efficiency. High-numerical-aperture (NA) detection objective lenses provide higher resolution, but their narrow depth of field inefficiently captures the fluorescence signal generated throughout the thickness of the illumination light sheet when imaging large volumes. Here, we present ExD-SPIM (extended depth-of-field selective-plane illumination microscopy), an improved light-sheet microscopy strategy that solves this limitation by extending the depth of field (DOF) of high-NA detection objectives to match the thickness of the illumination light sheet. This extension of the DOF uses a phase mask to axially stretch the point-spread function of the objective lens while largely preserving lateral resolution. This matching of the detection DOF to the illumination-sheet thickness increases the total fluorescence collection, reduces the background, and improves the overall signal-to-noise ratio (SNR), as shown by numerical simulations, imaging of bead phantoms, and imaging living animals. In comparison to conventional light sheet imaging with low-NA detection that yields equivalent DOF, the results show that ExD-SPIM increases the SNR by more than threefold and dramatically reduces the rate of photobleaching. Compared to conventional high-NA detection, ExD-SPIM improves the signal sensitivity and volumetric coverage of whole-brain activity imaging, increasing the number of detected neurons by over a third. 
    more » « less