As transportation electrification keeps accelerating across a wide range of vehicle classes from light-duty cars to heavy-duty trucks, the need for high-power electric vehicle (EV) charging equipment continues to grow rapidly. Even though the advancements in power electronics are enabling higher efficiency for EV chargers, thermal management continues to be a significant challenge in high-power charger development Liquid cooling with cold plates is commonly used for dissipating the heat generated by semiconductor devices m high-power chargers To design an effective and optimized thermal management system, accurate thermal modeling and analysis are critical, especially m the preliminary design phases. Complex fluid dynamics (CFD) software such as Ansys has been widely used for thermal modeling and analysis in the literature; however, using CFD analysis tools can be expensive, time-consuming, and computationally intense. To address the technical needs for a rapid, accurate preliminary thermal analysis tool, this paper presents a novel and accurate thermal modeling and analysis approach for high- power EV chargers with liquid cooling and Silicon Carbide (SiC) MOSFETs mounted on cold plates. The proposed modeling and analysis approach utilizes a lumped element model for each of the many pieces within the system to mathematically represent the physical system and form thermal networks. The effectiveness, accuracy, and light computational load of the proposed approach have been validated through experimental results conducted on a 21 kW power converter module hardware from a 1 MW EV wireless charge developed by the team for Class 8 semi-trucks.
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Silicon Carbide MOSFETs Aging Testing Platform for EV Chargers Using Power Cycling
As the widespread adoption of electric vehicles (EVs) keeps increasing, EV charger reliability is becoming critical to provide a satisfactory charging experience for EV users. Wide-bandgap semiconductors such as silicon Carbide (SiC) MOSFETs have been widely deployed in EV chargers for high efficiency, high power density, and thermal capabilities. However, the aging of SiC MOSFETs has not been fully studied with available aging data lacking significantly in the literature. This paper addresses the EV charger reliability problem by developing a new aging test platform for SiC MOSFETs that are commonly used in various EV chargers, collecting aging data with analysis to provide a new understanding of SiC MOSFET aging, and providing new insights into online EV charger health monitoring system design and development.
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- Award ID(s):
- 2239169
- PAR ID:
- 10526860
- Publisher / Repository:
- IEEE
- Date Published:
- ISBN:
- 979-8-3503-5133-0
- Page Range / eLocation ID:
- 655 to 660
- Subject(s) / Keyword(s):
- MOSFET, Power system measurements, Silicon carbide, Thermal engineering, Aging, Reliability engineering, Thermal stresses
- Format(s):
- Medium: X
- Location:
- Chengdu, China
- Sponsoring Org:
- National Science Foundation
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