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This paper presents a power-efficient complementary metal-oxide-semiconductor (CMOS) neural signal-recording read-out circuit for multichannel neuromodulation implants. The system includes a neural amplifier and a successive approximation register analog-to-digital converter (SAR-ADC) for recording and digitizing neural signal data to transmit to a remote receiver. The synthetic neural signal is generated using a LabVIEW myDAQ device and processed through a LabVIEW GUI. The read-out circuit is designed and fabricated in the standard 0.5 μμm CMOS process. The proposed amplifier uses a fully differential two-stage topology with a reconfigurable capacitive-resistive feedback network. The amplifier achieves 49.26 dB and 60.53 dB gain within the frequency bandwidth of 0.57–301 Hz and 0.27–12.9 kHz to record the local field potentials (LFPs) and the action potentials (APs), respectively. The amplifier maintains a noise–power tradeoff by reducing the noise efficiency factor (NEF) to 2.53. The capacitors are manually laid out using the common-centroid placement technique, which increases the linearity of the ADC. The SAR-ADC achieves a signal-to-noise ratio (SNR) of 45.8 dB, with a resolution of 8 bits. The ADC exhibits an effective number of bits of 7.32 at a low sampling rate of 10 ksamples/s. The total power consumption of the chip is 26.02 μμW, which makes it highly suitable for a multi-channel neural signal recording system.
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Intan Technologies integrated circuits can produce analog-to-digital conversion artifacts that affect neural signal acquisition
Abstract Objective.Intan Technologies’ integrated circuits (ICs) are valuable tools for neurophysiological data acquisition, providing signal amplification, filtering, and digitization from many channels (up to 64 channels/chip) at high sampling rates (up to 30 kSPS) within a compact package (⩽9× 7 mm). However, we found that the analog-to-digital converters (ADCs) in the Intan RHD2000 series ICs can produce artifacts in recorded signals. Here, we examine the effects of these ADC artifacts on neural signal quality and describe a method to detect them in recorded data.Approach.We identified two types of ADC artifacts produced by Intan ICs: 1) jumps, resulting from missing output codes, and 2) flatlines, resulting from overrepresented output codes. We identified ADC artifacts in neural recordings acquired with Intan RHD2000 ICs and tested the repeated performance of 17 ICsin vitro. With the on-chip digital-signal-processing disabled, we detected the ADC artifacts in each test recording by examining the distribution of unfiltered ADC output codes.Main Results.We found larger ADC artifacts in recordings using the Intan RHX data acquisition software versions 3.0–3.2, which did not run the necessary ADC calibration command when the inputs to the Intan recording controller were rescanned. This has been corrected in the Intan RHX software version 3.3. We found that the ADC calibration routine significantly reduced, but did not fully eliminate, the occurrence and size of ADC artifacts as compared with recordings acquired when the calibration routine was not run (p< 0.0001). When the ADC calibration routine was run, we found that the artifacts produced by each ADC were consistent over time, enabling us to sort ICs by performance.Significance.Our findings call attention to the importance of evaluating signal quality when acquiring electrophysiological data using Intan Technologies ICs and offer a method for detecting ADC artifacts in recorded data.
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- Award ID(s):
- 1752274
- PAR ID:
- 10550446
- Publisher / Repository:
- Journal of Neural Engineering
- Date Published:
- Journal Name:
- Journal of Neural Engineering
- Volume:
- 21
- Issue:
- 4
- ISSN:
- 1741-2560
- Page Range / eLocation ID:
- 044001
- Format(s):
- Medium: X
- Sponsoring Org:
- National Science Foundation
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- Free Publicly Accessible Full Text
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Accepted Manuscript1.0
- Journal Article:
- https://doi.org/10.1088/1741-2552/ad5762
