Wang, Bo, Zhou, Mengjun, Yang, Tiannan, and Chen, Long-Qing. A brief review on strain engineering of ferroelectric KxNa1−xNbO3 epitaxial thin films: Insights from phase-field simulations. Retrieved from https://par.nsf.gov/biblio/10573840. Journal of Materials Research 39.21 Web. doi:10.1557/s43578-024-01460-z.

Wang, Bo, Zhou, Mengjun, Yang, Tiannan, & Chen, Long-Qing. A brief review on strain engineering of ferroelectric KxNa1−xNbO3 epitaxial thin films: Insights from phase-field simulations. Journal of Materials Research, 39 (21). Retrieved from https://par.nsf.gov/biblio/10573840. https://doi.org/10.1557/s43578-024-01460-z

Wang, Bo, Zhou, Mengjun, Yang, Tiannan, and Chen, Long-Qing. "A brief review on strain engineering of ferroelectric KxNa1−xNbO3 epitaxial thin films: Insights from phase-field simulations". Journal of Materials Research 39 (21). Country unknown/Code not available: Springer. https://doi.org/10.1557/s43578-024-01460-z. https://par.nsf.gov/biblio/10573840.

@article{osti_10573840,
place = {Country unknown/Code not available}, title = {A brief review on strain engineering of ferroelectric KxNa1−xNbO3 epitaxial thin films: Insights from phase-field simulations}, url = {https://par.nsf.gov/biblio/10573840}, DOI = {10.1557/s43578-024-01460-z}, abstractNote = {}, journal = {Journal of Materials Research}, volume = {39}, number = {21}, publisher = {Springer}, author = {Wang, Bo and Zhou, Mengjun and Yang, Tiannan and Chen, Long-Qing}, }