Manna, Bibhas, Saha, Arnob, Jiang, Zhouhang, Ni, Kai, and Sengupta, Abhronil. Variation-Resilient FeFET-Based In-Memory Computing Leveraging Probabilistic Deep Learning. Retrieved from https://par.nsf.gov/biblio/10574887. IEEE Transactions on Electron Devices 71.5 Web. doi:10.1109/TED.2024.3378223.

Manna, Bibhas, Saha, Arnob, Jiang, Zhouhang, Ni, Kai, & Sengupta, Abhronil. Variation-Resilient FeFET-Based In-Memory Computing Leveraging Probabilistic Deep Learning. IEEE Transactions on Electron Devices, 71 (5). Retrieved from https://par.nsf.gov/biblio/10574887. https://doi.org/10.1109/TED.2024.3378223

Manna, Bibhas, Saha, Arnob, Jiang, Zhouhang, Ni, Kai, and Sengupta, Abhronil. "Variation-Resilient FeFET-Based In-Memory Computing Leveraging Probabilistic Deep Learning". IEEE Transactions on Electron Devices 71 (5). Country unknown/Code not available: IEEE Transactions on Electron Devices. https://doi.org/10.1109/TED.2024.3378223. https://par.nsf.gov/biblio/10574887.

@article{osti_10574887,
place = {Country unknown/Code not available}, title = {Variation-Resilient FeFET-Based In-Memory Computing Leveraging Probabilistic Deep Learning}, url = {https://par.nsf.gov/biblio/10574887}, DOI = {10.1109/TED.2024.3378223}, abstractNote = {}, journal = {IEEE Transactions on Electron Devices}, volume = {71}, number = {5}, publisher = {IEEE Transactions on Electron Devices}, author = {Manna, Bibhas and Saha, Arnob and Jiang, Zhouhang and Ni, Kai and Sengupta, Abhronil}, }