Li, Qi, Zhang, Jinan, Ye, Jin, Zhao, Liang, Hong, Tianqi, Lian, Jamie, Morkos, Beshoy, Sun, Hongyue, Zahiri, Feraidoon, Farnell, Chris, Mantooth, Alan, and Song, WenZhan. Online Dynamic Cyber-Attack Diagnosis in Power Electronics Systems Based on Few-Shot Learning. Retrieved from https://par.nsf.gov/biblio/10579916. Web. doi:10.1109/PESGM51994.2024.10689030.

Li, Qi, Zhang, Jinan, Ye, Jin, Zhao, Liang, Hong, Tianqi, Lian, Jamie, Morkos, Beshoy, Sun, Hongyue, Zahiri, Feraidoon, Farnell, Chris, Mantooth, Alan, & Song, WenZhan. Online Dynamic Cyber-Attack Diagnosis in Power Electronics Systems Based on Few-Shot Learning. Retrieved from https://par.nsf.gov/biblio/10579916. https://doi.org/10.1109/PESGM51994.2024.10689030

Li, Qi, Zhang, Jinan, Ye, Jin, Zhao, Liang, Hong, Tianqi, Lian, Jamie, Morkos, Beshoy, Sun, Hongyue, Zahiri, Feraidoon, Farnell, Chris, Mantooth, Alan, and Song, WenZhan. "Online Dynamic Cyber-Attack Diagnosis in Power Electronics Systems Based on Few-Shot Learning". Country unknown/Code not available: IEEE. https://doi.org/10.1109/PESGM51994.2024.10689030. https://par.nsf.gov/biblio/10579916.

@article{osti_10579916,
place = {Country unknown/Code not available}, title = {Online Dynamic Cyber-Attack Diagnosis in Power Electronics Systems Based on Few-Shot Learning}, url = {https://par.nsf.gov/biblio/10579916}, DOI = {10.1109/PESGM51994.2024.10689030}, abstractNote = {}, journal = {}, publisher = {IEEE}, author = {Li, Qi and Zhang, Jinan and Ye, Jin and Zhao, Liang and Hong, Tianqi and Lian, Jamie and Morkos, Beshoy and Sun, Hongyue and Zahiri, Feraidoon and Farnell, Chris and Mantooth, Alan and Song, WenZhan}, }