Ghosh, Supriya, Liu, Fengdeng, Nair, Sreejith, Raj, Rishi, Jalan, Bharat, and Mkhoyan, K Andre. Site-specific plan-view (S)TEM sample preparation from thin films using a dual-beam FIB-SEM. Retrieved from https://par.nsf.gov/biblio/10589259. Ultramicroscopy 270.C Web. doi:10.1016/j.ultramic.2025.114104.

Ghosh, Supriya, Liu, Fengdeng, Nair, Sreejith, Raj, Rishi, Jalan, Bharat, & Mkhoyan, K Andre. Site-specific plan-view (S)TEM sample preparation from thin films using a dual-beam FIB-SEM. Ultramicroscopy, 270 (C). Retrieved from https://par.nsf.gov/biblio/10589259. https://doi.org/10.1016/j.ultramic.2025.114104

Ghosh, Supriya, Liu, Fengdeng, Nair, Sreejith, Raj, Rishi, Jalan, Bharat, and Mkhoyan, K Andre. "Site-specific plan-view (S)TEM sample preparation from thin films using a dual-beam FIB-SEM". Ultramicroscopy 270 (C). Country unknown/Code not available: Elsevier. https://doi.org/10.1016/j.ultramic.2025.114104. https://par.nsf.gov/biblio/10589259.

@article{osti_10589259,
place = {Country unknown/Code not available}, title = {Site-specific plan-view (S)TEM sample preparation from thin films using a dual-beam FIB-SEM}, url = {https://par.nsf.gov/biblio/10589259}, DOI = {10.1016/j.ultramic.2025.114104}, abstractNote = {}, journal = {Ultramicroscopy}, volume = {270}, number = {C}, publisher = {Elsevier}, author = {Ghosh, Supriya and Liu, Fengdeng and Nair, Sreejith and Raj, Rishi and Jalan, Bharat and Mkhoyan, K Andre}, }