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Title: The “Platform 9¾ Problem” in Fluctuation Electron Microscopy
While the existence of a non-integer train station platform in the Harry Potter series is a source of delightful whimsy, the reality of electron detectors registering non-integer electrons can be a headache for electron microscopists worried about non-Poisson noise. Although there is no such thing as ¾ of an electron, when an electron enters a pixel in a direct electron detector, the signal energy can spread into neighboring pixels [1], giving a fractional signal. This seemingly innocent effect is a serious problem for Fluctuation Electron Microscopy (FEM) when attempting to correct Poisson noise in low- uence experiments [2]. The Poisson distribution applies strictly to countable discrete events.  more » « less
Award ID(s):
1906367
PAR ID:
10589393
Author(s) / Creator(s):
; ; ; ; ;
Publisher / Repository:
Microscopy and Microanalysis
Date Published:
Journal Name:
Microscopy and Microanalysis
Volume:
30
Issue:
Supplement_1
ISSN:
1431-9276
Format(s):
Medium: X
Sponsoring Org:
National Science Foundation
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