Ma, Desheng, Zeltmann, Steven E, Zhang, Chenyu, Baraissov, Zhaslan, Shao, Yu-Tsun, Duncan, Cameron, Maxson, Jared, Edelen, Auralee, and Muller, David A. Emittance minimization for aberration correction II: Physics-informed Bayesian optimization of an electron microscope. Retrieved from https://par.nsf.gov/biblio/10597694. Ultramicroscopy 273.C Web. doi:10.1016/j.ultramic.2025.114138.

Ma, Desheng, Zeltmann, Steven E, Zhang, Chenyu, Baraissov, Zhaslan, Shao, Yu-Tsun, Duncan, Cameron, Maxson, Jared, Edelen, Auralee, & Muller, David A. Emittance minimization for aberration correction II: Physics-informed Bayesian optimization of an electron microscope. Ultramicroscopy, 273 (C). Retrieved from https://par.nsf.gov/biblio/10597694. https://doi.org/10.1016/j.ultramic.2025.114138

Ma, Desheng, Zeltmann, Steven E, Zhang, Chenyu, Baraissov, Zhaslan, Shao, Yu-Tsun, Duncan, Cameron, Maxson, Jared, Edelen, Auralee, and Muller, David A. "Emittance minimization for aberration correction II: Physics-informed Bayesian optimization of an electron microscope". Ultramicroscopy 273 (C). Country unknown/Code not available: Elsevier. https://doi.org/10.1016/j.ultramic.2025.114138. https://par.nsf.gov/biblio/10597694.

@article{osti_10597694,
place = {Country unknown/Code not available}, title = {Emittance minimization for aberration correction II: Physics-informed Bayesian optimization of an electron microscope}, url = {https://par.nsf.gov/biblio/10597694}, DOI = {10.1016/j.ultramic.2025.114138}, abstractNote = {}, journal = {Ultramicroscopy}, volume = {273}, number = {C}, publisher = {Elsevier}, author = {Ma, Desheng and Zeltmann, Steven E and Zhang, Chenyu and Baraissov, Zhaslan and Shao, Yu-Tsun and Duncan, Cameron and Maxson, Jared and Edelen, Auralee and Muller, David A}, }