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Abstract Material properties strongly depend on the nature and concentration of defects. Characterizing these features may require nano- to atomic-scale resolution to establish structure–property relationships. 4D-STEM, a technique where diffraction patterns are acquired at a grid of points on the sample, provides a versatile method for highlighting defects. Computational analysis of the diffraction patterns with virtual detectors produces images that can map material properties. Here, using multislice simulations, we explore different virtual detectors that can be applied to the diffraction patterns that go beyond the binary response functions that are possible using ordinary STEM detectors. Using graphene and lead titanate as model systems, we investigate the application of virtual detectors to study local order and in particular defects. We find that using a small convergence angle with a rotationally varying detector most efficiently highlights defect signals. With experimental graphene data, we demonstrate the effectiveness of these detectors in characterizing atomic features, including vacancies, as suggested in simulations. Phase and amplitude modification of the electron beam provides another process handle to change image contrast in a 4D-STEM experiment. We demonstrate how tailored electron beams can enhance signals from short-range order and how a vortex beam can be used to characterize local symmetry.
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This content will become publicly available on June 1, 2026
Automated analysis of the visual properties of superconducting detectors
Abstract The testing and quality assurance of cryogenic superconducting detectors is a time- and labor-intensive process. As experiments deploy increasingly larger arrays of detectors, new methods are needed for performing this testing quickly. Here, we propose a process for flagging under-performing detector wafers before they are ever tested cryogenically. Detectors are imaged under an optical microscope, and computer vision techniques are used to analyze the images, searching for visual defects and other predictors of poor performance. Pipeline performance is verified via a suite of images with simulated defects, yielding a detection accuracy of 98.6%. Lastly, results from running the pipeline on prototype microwave kinetic inductance detectors from the planned SPT-3G+ experiment are presented.
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- PAR ID:
- 10608104
- Publisher / Repository:
- IOP Publishing
- Date Published:
- Journal Name:
- Journal of Instrumentation
- Volume:
- 20
- Issue:
- 06
- ISSN:
- 1748-0221
- Page Range / eLocation ID:
- P06011
- Format(s):
- Medium: X
- Sponsoring Org:
- National Science Foundation
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