Parekh, Varun Darshana, Xiao, Yi, Xu, Yixin, Zhao, Zijian, Jiang, Zhouhang, Biswas, Rudra, George, Sumitha, Ni, Kai, and Narayanan, Vijaykrishnan. A Study on the Impact of Temperature-Dependent Ferroelectric Switching Behavior in 3D Memory Architecture. Retrieved from https://par.nsf.gov/biblio/10608454. Web. doi:10.1109/VLSID64188.2025.00080.

Parekh, Varun Darshana, Xiao, Yi, Xu, Yixin, Zhao, Zijian, Jiang, Zhouhang, Biswas, Rudra, George, Sumitha, Ni, Kai, & Narayanan, Vijaykrishnan. A Study on the Impact of Temperature-Dependent Ferroelectric Switching Behavior in 3D Memory Architecture. Retrieved from https://par.nsf.gov/biblio/10608454. https://doi.org/10.1109/VLSID64188.2025.00080

Parekh, Varun Darshana, Xiao, Yi, Xu, Yixin, Zhao, Zijian, Jiang, Zhouhang, Biswas, Rudra, George, Sumitha, Ni, Kai, and Narayanan, Vijaykrishnan. "A Study on the Impact of Temperature-Dependent Ferroelectric Switching Behavior in 3D Memory Architecture". Country unknown/Code not available: IEEE. https://doi.org/10.1109/VLSID64188.2025.00080. https://par.nsf.gov/biblio/10608454.

@article{osti_10608454,
place = {Country unknown/Code not available}, title = {A Study on the Impact of Temperature-Dependent Ferroelectric Switching Behavior in 3D Memory Architecture}, url = {https://par.nsf.gov/biblio/10608454}, DOI = {10.1109/VLSID64188.2025.00080}, abstractNote = {}, journal = {}, publisher = {IEEE}, author = {Parekh, Varun Darshana and Xiao, Yi and Xu, Yixin and Zhao, Zijian and Jiang, Zhouhang and Biswas, Rudra and George, Sumitha and Ni, Kai and Narayanan, Vijaykrishnan}, }