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Various noise models have been developed in quantum computing study to describe the propagation and effect of the noise that is caused by imperfect implementation of hardware. Identifying parameters such as gate and readout error rates is critical to these models. We use a Bayesian inference approach to identify posterior distributions of these parameters such that they can be characterized more elaborately. By characterizing the device errors in this way, we can further improve the accuracy of quantum error mitigation. Experiments conducted on IBM’s quantum computing devices suggest that our approach provides better error mitigation performance than existing techniques used by the vendor. Also, our approach outperforms the standard Bayesian inference method in some scenarios.
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This content will become publicly available on May 5, 2026
Efficient separate quantification of state preparation errors and measurement errors on quantum computers and their mitigation
Current noisy quantum computers have multiple types of errors, which can occur in the state preparation, measurement/readout, and gate operation, as well as intrinsic decoherence and relaxation. Partly motivated by the booming of intermediate-scale quantum processors, measurement and gate errors have been recently extensively studied, and several methods of mitigating them have been proposed and formulated in software packages (e.g., in IBM Qiskit). Despite this, the state preparation error and the procedure to quantify it have not yet been standardized, as state preparation and measurement errors are usually considered not directly separable. Inspired by a recent work of Laflamme, Lin, and Mor \cite{laflamme2022algorithmic}, we propose a simple and resource-efficient approach to quantify separately the state preparation and readout error rates. With these two errors separately quantified, we also propose methods to mitigate them separately, especially mitigating state preparation errors with linear (with the number of qubits) complexity. As a result of the separate mitigation, we show that the fidelity of the outcome can be improved by an order of magnitude compared to the standard measurement error mitigation scheme. We also show that the quantification and mitigation scheme is resilient against gate noise and can be immediately applied to current noisy quantum computers. To demonstrate this, we present results from cloud experiments on IBM's superconducting quantum computers. The results indicate that the state preparation error rate is also an important metric for qubit metrology that can be efficiently obtained.
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- Award ID(s):
- 2310614
- PAR ID:
- 10616653
- Publisher / Repository:
- Quantum
- Date Published:
- Journal Name:
- Quantum
- Volume:
- 9
- ISSN:
- 2521-327X
- Page Range / eLocation ID:
- 1724
- Format(s):
- Medium: X
- Sponsoring Org:
- National Science Foundation
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