Clustering continues to be an important tool for data engineering and analysis. While advances in deep learning tend to be at the forefront of machine learning, it is only useful for the supervised classification of data sets. Clustering is an essential tool for problems where labeling data sets is either too labor intensive or where there is no agreed upon ground truth. The well studied k-means problem partitions groups of similar vectors into k clusters by iteratively updating the cluster assignment such that it minimizes the within cluster sum of squares metric. Unfortunately k-means can become prohibitive for very large high dimensional data sets as iterative methods often rely on random access to, or multiple passes over, the data set — a requirement that is not often possible for large and potentially unbounded data sets. In this work we explore an randomized, approximate method for clustering called Tree-Walk Random Projection Clustering (TWRP) that is a fast, memory efficient method for finding cluster embedding in high dimensional spaces. TWRP combines random projection with a tree based partitioner to achieve a clustering method that forgoes storing the exhaustive representation of all vectors in the data space and instead performs a bounded search over the implied cluster bifurcation tree represented as approximate vector and count values. The TWRP algorithm is described and experimentally evaluated for scalability and accuracy in the presence of noise against several other well-known algorithms.
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Clustering characteristic diffraction vectors in 4-D STEM data sets from overlapping structures in nanocrystalline and amorphous materials
We describe a method for identifying and clustering diffraction vectors in four-dimensional (4-D) scanning transmission electron microscopy data to determine characteristic diffraction patterns from overlapping structures in projection. First, the data is convolved with a 4-D kernel, then diffraction vectors are identified and clustered using both density-based clustering and a metric that emphasizes rotational symmetries. The method works well for both crystalline and amorphous samples and in high- and low-dose experiments. A simulated dataset of overlapping aluminum nanocrystals provides performance metrics as a function of Poisson noise and the number of overlapping structures. Experimental data from an aluminum nanocrystal sample shows similar performance. For an amorphous Pd77.5Cu6Si16.5 thin film, experiments measuring glassy structure show strong evidence of 4- and 6-fold symmetry structures. A significant background arises from the diffraction of overlapping structures. Quantifying this background helps to separate contributions from single, rotationally symmetric structures vs. apparent symmetries arising from overlapping structures in projection.
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- Award ID(s):
- 2204632
- PAR ID:
- 10629754
- Publisher / Repository:
- Elsevier
- Date Published:
- Journal Name:
- Ultramicroscopy
- Volume:
- 267
- Issue:
- C
- ISSN:
- 0304-3991
- Page Range / eLocation ID:
- 114040
- Subject(s) / Keyword(s):
- 4-D STEM Amorphous Structure Nanocrystal Characterization Glass Structure Symmetry Clustering Electron Diffraction
- Format(s):
- Medium: X
- Sponsoring Org:
- National Science Foundation
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