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Abstract The response of forsterite, Mg2SiO4, under dynamic compression is of fundamental importance for understanding its phase transformations and high‐pressure behavior. Here, we have carried out an in situ X‐ray diffraction study of laser‐shocked polycrystalline and single‐crystal forsterite (a‐,b‐, andc‐orientations) from 19 to 122 GPa using the Matter in Extreme Conditions end‐station of the Linac Coherent Light Source. Under laser‐based shock loading, forsterite does not transform to the high‐pressure equilibrium assemblage of MgSiO3bridgmanite and MgO periclase, as has been suggested previously. Instead, we observe forsterite and forsterite III, a metastable polymorph of Mg2SiO4, coexisting in a mixed‐phase region from 33 to 75 GPa for both polycrystalline and single‐crystal samples. Densities inferred from X‐ray diffraction data are consistent with earlier gas‐gun shock data. At higher stress, the response is sample‐dependent. Polycrystalline samples undergo amorphization above 79 GPa. For [010]‐ and [001]‐oriented crystals, a mixture of crystalline and amorphous material is observed to 108 GPa, whereas the [100]‐oriented forsterite adopts an unknown phase at 122 GPa. The first two sharp diffraction peaks of amorphous Mg2SiO4show a similar trend with compression as those observed for MgSiO3in both recent static‐ and laser‐driven shock experiments. Upon release to ambient pressure, all samples retain or revert to forsterite with evidence for amorphous material also present in some cases. This study demonstrates the utility of femtosecond free‐electron laser X‐ray sources for probing the temporal evolution of high‐pressure silicate structures through the nanosecond‐scale events of shock compression and release.
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This content will become publicly available on December 1, 2025
Clustering characteristic diffraction vectors in 4-D STEM data sets from overlapping structures in nanocrystalline and amorphous materials
We describe a method for identifying and clustering diffraction vectors in four-dimensional (4-D) scanning transmission electron microscopy data to determine characteristic diffraction patterns from overlapping structures in projection. First, the data is convolved with a 4-D kernel, then diffraction vectors are identified and clustered using both density-based clustering and a metric that emphasizes rotational symmetries. The method works well for both crystalline and amorphous samples and in high- and low-dose experiments. A simulated dataset of overlapping aluminum nanocrystals provides performance metrics as a function of Poisson noise and the number of overlapping structures. Experimental data from an aluminum nanocrystal sample shows similar performance. For an amorphous Pd77.5Cu6Si16.5 thin film, experiments measuring glassy structure show strong evidence of 4- and 6-fold symmetry structures. A significant background arises from the diffraction of overlapping structures. Quantifying this background helps to separate contributions from single, rotationally symmetric structures vs. apparent symmetries arising from overlapping structures in projection.
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- Award ID(s):
- 2204632
- PAR ID:
- 10629754
- Publisher / Repository:
- Elsevier
- Date Published:
- Journal Name:
- Ultramicroscopy
- Volume:
- 267
- Issue:
- C
- ISSN:
- 0304-3991
- Page Range / eLocation ID:
- 114040
- Subject(s) / Keyword(s):
- 4-D STEM Amorphous Structure Nanocrystal Characterization Glass Structure Symmetry Clustering Electron Diffraction
- Format(s):
- Medium: X
- Sponsoring Org:
- National Science Foundation
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