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Title: Impact of Mechanical Strain on Auger Recombination in InGaAs/InP
We characterized the impact of mechanically-applied biaxial strain on Auger recombination in InGaAs quantum wells using time-resolved photoluminescence. Our results support that Auger recombination is reduced by mechanical distortion introduced by strained-layer epitaxy.  more » « less
Award ID(s):
2133195
PAR ID:
10630827
Author(s) / Creator(s):
; ; ; ; ; ; ;
Publisher / Repository:
Optica Publishing Group
Date Published:
ISBN:
978-1-957171-39-5
Page Range / eLocation ID:
JTh2A.14
Format(s):
Medium: X
Location:
Charlotte, North Carolina
Sponsoring Org:
National Science Foundation
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