Wei, Jingrui, and Voyles, Paul M. Aberration Measurement from Crystalline Ronchigrams with an Attention Neural Network. Retrieved from https://par.nsf.gov/biblio/10642141. Microscopy and Microanalysis 30.Supplement_1 Web. doi:10.1093/mam/ozae044.194.

Wei, Jingrui, & Voyles, Paul M. Aberration Measurement from Crystalline Ronchigrams with an Attention Neural Network. Microscopy and Microanalysis, 30 (Supplement_1). Retrieved from https://par.nsf.gov/biblio/10642141. https://doi.org/10.1093/mam/ozae044.194

Wei, Jingrui, and Voyles, Paul M. "Aberration Measurement from Crystalline Ronchigrams with an Attention Neural Network". Microscopy and Microanalysis 30 (Supplement_1). Country unknown/Code not available: Microscopy and Microanalysis. https://doi.org/10.1093/mam/ozae044.194. https://par.nsf.gov/biblio/10642141.

@article{osti_10642141,
place = {Country unknown/Code not available}, title = {Aberration Measurement from Crystalline Ronchigrams with an Attention Neural Network}, url = {https://par.nsf.gov/biblio/10642141}, DOI = {10.1093/mam/ozae044.194}, abstractNote = {Not Available}, journal = {Microscopy and Microanalysis}, volume = {30}, number = {Supplement_1}, publisher = {Microscopy and Microanalysis}, author = {Wei, Jingrui and Voyles, Paul M}, }