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Abstract In this study, we explore the operation and performance of electrolyte-gated junctionless III-V nanowire (NW) transistors featuring compositionally graded In_xGa_1-xAs channels. These devices leverage the electric double-layer (EDL) gating mechanism at the electrolyte/semiconductor interface to achieve ultra-high charge carrier densities, surpassing those possible with conventional oxide dielectrics. Fermi–Dirac statistics are introduced by a numerical method to reproduce associated charge densities of EDL transistors. A 1 nm interfacial HfO₂layer is introduced to capture the electrostatics of the EDL, prevent charge transfer between the electrolyte and the semiconductor, and mimic the Stern layer. Device simulations are conducted to optimize the heterostructured NW composition and doping profile, followed by benchmarking against traditional HfO₂-gated structures. The EDL-gated device achieves anI_ON/I_OFFratio of 10⁶, with a subthreshold slope of 60 mV/dec and a threshold voltage of 0.31 V at a low drain voltage of 0.3 V, indicating a two-order magnitude improvement over conventional junctionless oxide-gated NW transistors. Computational methodologies include finite element modeling in COMSOL to extract voltage-dependent ion densities and subsequent device simulations using Silvaco's Atlas software. The results indicate that the optimized EDL-gated device exhibits superior electrostatic integrity and performance metrics compared to conventional gating methods. The findings underscore the potential of EDL gating in III-V NW configurations for advanced electronic applications, demonstrating significant improvements in switching characteristics and power efficiency. Further optimization and exploration of bias-dependent ionic concentrations and configurable device geometries highlight the robustness and scalability of this approach for next-generation low-power electronics. 

Mixed organic–inorganic halide perovskite-based solar cells have attracted interest in recent years due to their potential for both terrestrial and space applications. Analysis of interfaces is critical to predicting device behavior and optimizing device architectures. Most advanced tools to study buried interfaces are destructive in nature and can induce further degradation. Ion beam techniques, such as Rutherford backscattering spectrometry (RBS), is a useful non-destructive method to probe an elemental depth profile of multilayered perovskite solar cells (PSCs) as well as to study the inter-diffusion of various elemental species across interfaces. Additionally, PSCs are becoming viable candidates for space photovoltaic applications, and it is critical to investigate their radiation-induced degradation. RBS can be simultaneously utilized to analyze the radiation effects induced by He+ beam on the device, given their presence in space orbits. In the present work, a 2 MeV He+ beam was used to probe the evidence of elemental diffusion across PSC interfaces with architecture glass/ITO/SnO2/Cs0.05(MA0.17FA0.83)0.95Pb(I0.83Br0.17)3/spiro-OMeTAD/MoO3/Au. During the analysis, the device active area was exposed to an irradiation equivalent of up to 1.62 × 1015 He+/cm2, and yet, no measurable evidence (with a depth resolution ∼1 nm) of beam-induced ion migration was observed, implying high radiation tolerance of PSCs. On the other hand, aged PSCs exhibited indications of the movement of diverse elemental species, such as Au, Pb, In, Sn, Br, and I, in the active area of the device, which was quantified with the help of RBS. 

This paper discusses the in-situ characterization tools designed to assess radiation tolerance and elemental migration in perovskite materials. With the increasing use of perovskites in various technological applications, understanding their response to radiation exposure is paramount. Ion Beam Induced Charge (IBIC) emerges as a powerful tool for investigating the radiation tolerance of perovskites at the microscale. By employing focused ion beams, IBIC allows for the spatial mapping of charge carriers, offering insights into the material's electronic response to radiation-induced defects. This technique enables researchers to pinpoint areas of enhanced or suppressed charge collection, providing valuable information on the perovskite's intrinsic properties under irradiation. Rutherford Backscattering Spectrometry (RBS) complements the study by offering a quantitative analysis of elemental migration in perovskite materials. Through the precise measurement of backscattered ions, RBS provides a detailed understanding of the elemental composition and distribution within the perovskite lattice after radiation exposure. The integration of IBIC and RBS techniques in in-situ experiments enhances the comprehensive characterization of radiation effects on perovskites. 

Abstract This study investigates how sustained low Earth orbit (LEO) exposure affects metal halide perovskite (MHP) thin films and perovskite solar cells (PSCs). It examines samples deployed on the Materials International Space Station Experiment (MISSE) 15 and 16 missions. Five methylammonium lead iodide (MAPI) thin films are deployed on MISSE‐16, each with distinct UV filters to selectively attenuate AM0 spectral bands. While post‐flight optical analysis reveals that the least UV‐exposed film exhibits the highest emission and lowest non‐radiative recombination rate, no clear correlation is observed among the rest, and all MAPI films maintained excellent integrity throughout the mission. MISSE‐15 deployed eight PSCs with diverse structures, MHP compositions, and contact materials. Post‐flight analysis reveals stable, highly emissive MHPs, but damaged contacts due to ion migration, which caused loss of electrical response. The MISSE missions demonstrate MHPs’ suitability for space applications, while highlighting the need for improved interfacial layers and contact materials to enhance charge carrier mobility, prevent ion migration, and improve charge carrier extraction efficiency. 

Perovskite photovoltaics have been shown to recover, or heal, after radiation damage. Here, we deconvolve the effects of radiation based on different energy loss mechanisms from incident protons which induce defects or can promote efficiency recovery. We design a dual dose experiment first exposing devices to low-energy protons efficient in creating atomic displacements. Devices are then irradiated with high-energy protons that interact differently. Correlated with modeling, high-energy protons (with increased ionizing energy loss component) effectively anneal the initial radiation damage, and recover the device efficiency, thus directly detailing the different interactions of irradiation. We relate these differences to the energy loss (ionization or non-ionization) using simulation. Dual dose experiments provide insight into understanding the radiation response of perovskite solar cells and highlight that radiation-matter interactions in soft lattice materials are distinct from conventional semiconductors. These results present electronic ionization as a unique handle to remedying defects and trap states in perovskites. 

Formamidinium cesium (FACs) perovskites solar cells have been shown to be among the most stable metal halide perovskites. Here, high-temperature data are presented which systematically and statistically demonstrate the high thermal operation of this system to temperatures in excess of 200 °C. Device measurements between 250 K and 490 K show that while some loss of performance is evident at higher temperature, this is driven by reversible halide segregation with no evidence of a structural phase transition over the measurement range probed. Moreover, upon reduction of the temperature back to ambient the power conversion efficiency is retained. 

Perovskite photovoltaics (PVs) are under intensive development for promise in terrestrial energy production. Soon, the community will find out how much of that promise may become reality. Perovskites also open new opportunities for lower cost space power. However, radiation tolerance of space environments requires appropriate analysis of relevant devices irradiated under representative radiation conditions. We present guidelines designed to rigorously test the radiation tolerance of perovskite PVs. We review radiation conditions in common orbits, calculate nonionizing and ionizing energy losses (NIEL and IEL) for perovskites, and prioritize proton radiation for effective nuclear interactions. Low-energy protons (0.05–0.15 MeV) create a representative uniform damage profile, whereas higher energy protons (commonly used in ground-based evaluation) require significantly higher fluence to accumulate the equivalent displacement damage dose due to lower scattering probability. Furthermore, high-energy protons may ‘‘heal’’ devices through increased electronic ionization. These procedural guidelines differ from those used to test conventional semiconductors.