This paper presents an absolute phase unwrapping method for high-speed three-dimensional (3D) shape measurement. This method uses three phase-shifted patterns and one binary random pattern on a single-camera, single-projector structured light system. We calculate the wrapped phase from phase-shifted images and determine the coarse correspondence through the digital image correlation (DIC) between the captured binary random pattern of the object and the pre-captured binary random pattern of a flat surface. We then developed a computational framework to determine fringe order number pixel by pixel using the coarse correspondence information. Since only one additional pattern is used, the proposed method can be used for high-speed 3D shape measurement. Experimental results successfully demonstrated that the proposed method can achieve high-speed and high-quality measurement of complex scenes.
Note: When clicking on a Digital Object Identifier (DOI) number, you will be taken to an external site maintained by the publisher.
Some full text articles may not yet be available without a charge during the embargo (administrative interval).
What is a DOI Number?
Some links on this page may take you to non-federal websites. Their policies may differ from this site.
-
-
Zhang, Song ; Harding, Kevin G. ; Li, Beiwen ; Hyun, Jae-Sang (Ed.)Free, publicly-accessible full text available May 31, 2023
-
Free, publicly-accessible full text available June 1, 2023
-
Free, publicly-accessible full text available May 13, 2023
-
This paper presents a calibration method for a microscopic structured light system with an extended depth of field (DOF). We first employed the focal sweep technique to achieve large enough depth measurement range, and then developed a computational framework to alleviate the impact of phase errors caused by the standard off-the-shelf calibration target (black circles with a white background). Specifically, we developed a polynomial interpolation algorithm to correct phase errors near the black circles to obtain more accurate phase maps for projector feature points determination. Experimental results indicate that the proposed method can achieve a measurement accuracy of approximately 1.0 μ m for a measurement volume of approximately 2,500 μ m (W) × 2,000 μ m (H) × 500 μ m (D).