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  1. Despite the dramatic progress that has been made in the power-conversion efficiency (PCE) of perovskite solar cells (PVSCs), there are still many obstacles to be overcome before these devices can be economically competitive in the photovoltaics market. One of the major hurdles in the commercialization of PVSCs is low stability, which severely limits the effective lifetime of the devices. One of the approaches to achieving higher stability and lifetime of PVSCs is improvement of PVSC film quality. In this paper, we have employed a PAMAM dendrimer layer to reduce the surface roughness of sputter-deposited indium-tin oxide (ITO) films, which were then used in the fabrication of PVSCs. A PAMAM-8 dendrimer layer was deposited by dip-coating the substrates in 25 mL of a 1 μMPAMAM-8 ethanol solution before ITOdeposition. X-ray refractivity (XRR)was used to verify the PAMAMlayer on the substrate. ITOfilms of 150 nm thicknesswere then deposited onto the PAMAMlayer using DC magnetron reactive sputtering. The surface roughness, sheet resistance, and transmissivity of the ITO films were optimized by varying the parameters of the sputtering process. Atomic force microscopy (AFM) was used to measure the surface roughness of the ITO films with and without PAMAM dendrimer layer. A root-mean-square (RMS) film roughness of 1.6 nm, sheet resistance of 21 /ϒ, and transmissivity of > 91% at a wavelength of 400–700 nm were obtained after optimization. 
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