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Abstract The development of high‐quality diamond films is pivotal for driving advances in quantum technology, power electronics, and thermal management. The ion implantation and lift‐off technique has emerged as a crucial method for fabricating diamond films with controlled thickness and scalable production of large‐area diamond wafers. This study advances the understanding of critical interface dynamics during diamond epilayer growth on ion‐implanted commercial diamond substrates. Leveraging high‐resolution cross‐sectional electron microscopy and spectroscopic analyses, the direct transformation of the damaged diamond layer is revealed into a graphitic layer during epilayer overgrowth, eliminating the need for high‐temperature annealing. Raman and photoluminescence spectroscopy mappings along the side section highlight the exceptional quality and purity of the epilayer, showcasing nitrogen‐vacancy center densities comparable to electronic‐grade diamond, making it highly suitable for quantum and electronic applications. Finally, the epilayer detaches efficiently via electrochemical etching, leaving a substrate with low surface roughness that is reusable for multiple growth cycles. These results provide valuable insights into refining the ion implantation and lift‐off process, bridging critical gaps in interface evolution, and establishing a foundation for sustainable, high‐performance diamond films across diverse technological applications. 

Image resolution and field of view in far-field optical microscopy are often inversely proportional to one another due to digital sampling limitations imposed by the magnification of the system and the pixel size of the sensor. We present a method including a spatial shifting mechanism and a reconstruction algorithm that bypasses this trade-off by shifting the sample to be imaged by subpixel increments, before registering the images via phase correlation and combining the resulting registered images using the shift-and-add approach. Importantly, this method requires no specific optical components that are uncommon to commercially available or custom-built microscope systems. The findings of the presented study demonstrate an improvement to spatial resolution of ∼42% while maintaining the system’s field of view (FOV), leading to a more than twofold improvement to the system’s space–bandwidth product (SBP).