More Like this

1. scanning frequency comb microscopy: a new method in scanning probe microscopy

   https://doi.org/10.13140/RG.2.2.34585.72804  

   Hagmann, M. (August 2018, scanning frequency comb microscopy: a new method in scanning probe microscopy)

   Finer resolution with greater stability is possible using unique low-power (aW), low-noise (20 dB S/N), microwave harmonics generated within a nanoscale tip-sample junction for feedback control in place of the DC tunneling current. Please see the attached poster to be presented at the Microscopy & Microanalysis-2018 meeting in Baltimore Monday August 6th as Post-deadline poster PDP-18. Applications include true sub-nm resolution in the carrier profiling of semiconductors. This method is especially appropriate for resistive samples where the spreading resistance flattens plots of the tunneling current vs. tip-sample distance with a scanning tunneling microscope. 

   more » « less
2. Scanning Ion Conductance Microscopy

   https://doi.org/10.1021/acs.chemrev.0c00962  

   Zhu, Cheng; Huang, Kaixiang; Siepser, Natasha P.; Baker, Lane A. (December 2020, Chemical Reviews)

   null (Ed.)
3. Biphasic-Scanning Ion Conductance Microscopy

   https://doi.org/10.1021/ACS.ANALCHEM.8B03660  

   Choi, Myunghoon; Baker, Lane A. (September 2018, Analytical Chemistry)

   null (Ed.)
4. Two-photon laser scanning microscopy with electrowetting-based prism scanning

   https://doi.org/10.1364/BOE.8.005412  

   Supekar, Omkar D.; Ozbay, Baris N.; Zohrabi, Mo; Nystrom, Philip D.; Futia, Gregory L.; Restrepo, Diego; Gibson, Emily A.; Gopinath, Juliet T.; Bright, Victor M. (November 2017, Biomedical Optics Express)
5. Image Super Resolution for Scanning Tunneling Microscopy and Atomic Force Microscopy

   https://doi.org/10.1109/URTC60662.2023.10534971  

   Li, Rockwell T; Cenese, Marjorie; Zhang, Yuan (October 2023, IEEE)