Renaud, Luke, Baylon, Joseph, Gopal, Srinivasan, Hoque, Md Aminul, and Heo, Deukhyoun. Analysis of Systematic Losses in Hybrid Envelope Tracking Modulators. Retrieved from https://par.nsf.gov/biblio/10094500. IEEE Transactions on Circuits and Systems I: Regular Papers 66.4 Web. doi:10.1109/TCSI.2018.2883531.

Renaud, Luke, Baylon, Joseph, Gopal, Srinivasan, Hoque, Md Aminul, & Heo, Deukhyoun. Analysis of Systematic Losses in Hybrid Envelope Tracking Modulators. IEEE Transactions on Circuits and Systems I: Regular Papers, 66 (4). Retrieved from https://par.nsf.gov/biblio/10094500. https://doi.org/10.1109/TCSI.2018.2883531

Renaud, Luke, Baylon, Joseph, Gopal, Srinivasan, Hoque, Md Aminul, and Heo, Deukhyoun. "Analysis of Systematic Losses in Hybrid Envelope Tracking Modulators". IEEE Transactions on Circuits and Systems I: Regular Papers 66 (4). Country unknown/Code not available. https://doi.org/10.1109/TCSI.2018.2883531. https://par.nsf.gov/biblio/10094500.

@article{osti_10094500,
place = {Country unknown/Code not available}, title = {Analysis of Systematic Losses in Hybrid Envelope Tracking Modulators}, url = {https://par.nsf.gov/biblio/10094500}, DOI = {10.1109/TCSI.2018.2883531}, abstractNote = {}, journal = {IEEE Transactions on Circuits and Systems I: Regular Papers}, volume = {66}, number = {4}, author = {Renaud, Luke and Baylon, Joseph and Gopal, Srinivasan and Hoque, Md Aminul and Heo, Deukhyoun}, }