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Title: Effect of varying the gate voltage scan rate in a MoS 2 /ferroelectric polymer field effect transistor
Award ID(s):
1800262
PAR ID:
10133205
Author(s) / Creator(s):
; ; ; ;
Date Published:
Journal Name:
Ferroelectrics
Volume:
550
Issue:
1
ISSN:
0015-0193
Page Range / eLocation ID:
1 to 11
Format(s):
Medium: X
Sponsoring Org:
National Science Foundation
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