The traditional von Neumann architecture limits the increase in computing efficiency and results in massive power consumption in modern computers due to the separation of storage and processing units. The novel neuromorphic computation system, an in-memory computing architecture with low power consumption, is aimed to break the bottleneck and meet the needs of the next generation of artificial intelligence (AI) systems. Thus, it is urgent to find a memory technology to implement the neuromorphic computing nanosystem. Nowadays, the silicon-based flash memory dominates non-volatile memory market, however, it is facing challenging issues to achieve the requirements of future data storage device development due to the drawbacks, such as scaling issue, relatively slow operation speed, and high voltage for program/erase operations. The emerging resistive random-access memory (RRAM) has prompted extensive research as its simple two-terminal structure, including top electrode (TE) layer, bottom electrode (BE) layer, and an intermediate resistive switching (RS) layer. It can utilize a temporary and reversible dielectric breakdown to cause the RS phenomenon between the high resistance state (HRS) and the low resistance state (LRS). RRAM is expected to outperform conventional memory device with the advantages, notably its low-voltage operation, short programming time, great cyclic stability, and good scalability. Among the materials for RS layer, indium gallium zinc oxide (IGZO) has shown attractive prospects in abundance and high atomic diffusion property of oxygen atoms, transparency. Additionally, its electrical properties can be easily modulated by controlling the stoichiometric ratio of indium and gallium as well as oxygen potential in the sputter gas. Moreover, since the IGZO can be applied to both the thin-film transistor (TFT) channel and RS layer, it has a great potential for fully integrated transparent electronics application. In this work, we proposed amorphous transparent IGZO-based RRAMs and investigated switching behaviors of the memory cells prepared with different top electrodes. First, ITO was choosing to serve as both TE and BE to achieve high transmittance. A multi-target magnetron sputtering system was employed to deposit all three layers (TE, RS, BE layers) on glass substrate. I-V characteristics were evaluated by a semiconductor parameter analyzer, and the bipolar RS feature of our RRAM devices was demonstrated by typical butterfly curves. The optical transmission analysis was carried out via a UV-Vis spectrometer and the average transmittance was around 80% out of entire devices in the visible-light wavelength range, implying high transparency. We adjusted the oxygen partial pressure during the sputtering of IGZO to optimize the property because the oxygen vacancy concentration governs the RS performance. Electrode selection is crucial and can impact the performance of the whole device. Thus, Cu TE was chosen for our second type of device because the diffusion of Cu ions can be beneficial for the formation of the conductive filament (CF). A ~5 nm SiO 2 barrier layer was employed between TE and RS layers to confine the diffusion of Cu into the RS layer. At the same time, this SiO 2 inserting layer can provide an additional interfacial series resistance in the device to lower the off current, consequently, improve the on/off ratio and whole performance. Finally, an oxygen affinity metal Ti was selected as the TE for our third type of device because the concentration of the oxygen atoms can be shifted towards the Ti electrode, which provides an oxygengettering activity near the Ti metal. This process may in turn lead to the formation of a sub-stoichiometric region in the neighboring oxide that is believed to be the origin of better performance. In conclusion, the transparent amorphous IGZO-based RRAMs were established. To tune the property of RS layer, the sputtering conditions of RS were varied. To investigate the influence of TE selections on switching performance of RRAMs, we integrated a set of TE materials, and a barrier layer on IGZO-based RRAM and compared the switch characteristics. Our encouraging results clearly demonstrate that IGZO is a promising material in RRAM applications and breaking the bottleneck of current memory technologies.
more »
« less
Pair distribution functions of amorphous organic thin films from synchrotron X-ray scattering in transmission mode
Using high-brilliance high-energy synchrotron X-ray radiation, for the first time the total scattering of a thin organic glass film deposited on a strongly scattering inorganic substrate has been measured in transmission mode. The organic thin film was composed of the weakly scattering pharmaceutical substance indomethacin in the amorphous state. The film was 130 µm thick atop a borosilicate glass substrate of equal thickness. The atomic pair distribution function derived from the thin-film measurement is in excellent agreement with that from bulk measurements. This ability to measure the total scattering of amorphous organic thin films in transmission will enable accurate in situ structural studies for a wide range of materials.
more »
« less
- Award ID(s):
- 1720415
- NSF-PAR ID:
- 10133730
- Date Published:
- Journal Name:
- IUCrJ
- Volume:
- 4
- Issue:
- 5
- ISSN:
- 2052-2525
- Page Range / eLocation ID:
- 555 to 559
- Format(s):
- Medium: X
- Sponsoring Org:
- National Science Foundation
More Like this
-
-
more » « less
Abstract A method for the deposition and functionalization of a nanostructured organotitanate thin film, which imparts superhydrophilicity to a surface with a one‐step, open‐air process, is described. Extreme wetting (
Θ < 5°) is achieved through synergistic contributions from both nanoscale roughness, visible light absorption caused by nonmetal dopants, and oxygen vacancies and surface activation by reactive plasma species. To test the efficacy of this material as an antifog coating, glass is coated and subjected to aggressive changes in humidity. Under both fogging and defrosting conditions, the superhydrophilic coating achieves a high degree of transparency, showing nearly two orders of magnitude improvement over the bare glass. The measured adhesion of the superhydrophilic coating is 5.9 J m−2, nearly double that of the solution‐processed control. The reliability of the coating is further validated by demonstrating scratch‐resistance. Additionally, the incorporation of organic matter into the molecular structure of the coating disrupts long‐range crystallinity from developing. This structural and subsequent chemical analysis of the coating reveals that inorganic and organic species are intimately connected at the nanoscale via alkyl and alkoxy bridges. The amorphous organotitanate material is distinct from conventional TiO2, which requires high temperature crystallization and extensive UV irradiation to display similar superhydrophilic qualities. -
In this paper, carbon thin films were grown using the plasma-enhanced atomic layer deposition (PE-ALD). Methane (CH4) was used as the carbon precursor to grow the carbon thin film. The grown film was analyzed by the high-resolution transmission electron micrograph (TEM), X-ray photoelectron spectroscopy (XPS) analysis, and Raman spectrum analysis. The analyses show that the PE-ALD-grown carbon film has an amorphous structure. It was found that the existence of defective sites (nanoscale holes or cracks) on the substrate of copper foil could facilitate the formation of nanolayered carbon films. The mechanism for the formation of nanolayered carbon film in the nanoscale holes was discussed. This finding could be used for the controlled growth of nanolayered carbon films or other two-dimensional nanomaterials while combining with modern nanopatterning techniques.more » « less
-
more » « less
Abstract Ultra‐stable amorphous fluoropolymers glasses were created using vacuum pyrolysis deposition (VPD). Glass films with thickness ranging from 90 to 160 nm were grown at a substrate temperature of 0.86
T g, whereT gis the glass transition temperature of the virgin polymer and is in units of K. Atomic force microscope (AFM) dilatometry measurements were conducted to investigate density behavior of the ultra‐stable glasses. Thickness measurements were made in stepwise fashion over a range of temperatures from ambient to above theT g. Results show that the intersections of the line for the equilibrium liquid and those for the rejuvenated and stable glasses identifying the fictive temperatureT fresult inT f, rejuvenated = 347.3 K andT f, stable = 269.5 K, that is, nearly 80 K below theT gof the rejuvenated material and well below the notional Kauzmann temperature as estimated from the Vogel‐Fultcher‐Tammann (VFT) analysis of the cooling rate dependence of the calorimetric glass transition temperature reported previously. The results corroborate the published calorimetric results on the same ultra‐stable fluoropolymer glasses that witnessedT freductions of up to 62.6 K below theT gof the rejuvenated system. In addition, to demonstrate the versatility of the AFM dilatometry methodology for the thin film response, isothermal de‐aging experiments were carried out to illustrate the devitrification kinetics. We also carried out one of the Kovacs’ signature key experiments, the asymmetry of approach, to further illustrate the method. -
Recent demonstrations of melting in the metal–organic framework (MOF) family have created interest in the interfacial domain between inorganic glasses and amorphous organic polymers. The chemical and physical behaviour of porous hybrid liquids and glasses is of particular interest, though opportunities are limited by the inaccessible melting temperatures of many MOFs. Here, we show that the processing technique of flux melting, ‘borrowed’ from the inorganic domain, may be applied in order to melt ZIF-8, a material which does not possess an accessible liquid state in the pure form. Effectively, we employ the high-temperature liquid state of one MOF as a solvent for a secondary, non-melting MOF component. Differential scanning calorimetry, small- and wide-angle X-ray scattering, electron microscopy and X-ray total scattering techniques are used to show the flux melting of the crystalline component within the liquid. Gas adsorption and positron annihilation lifetime spectroscopy measurements show that this results in enhanced, accessible porosity to a range of guest molecules in the resultant flux melted MOF glass.more » « less
- Free Publicly Accessible Full Text
-
Accepted Manuscript1.0
- Journal Article:
- https://doi.org/10.1107/s2052252517009344
