Accuracy of tip-sample interaction measurements using dynamic atomic force microscopy techniques: Dependence on oscillation amplitude, interaction strength, and tip-sample distance
- Award ID(s):
- 1808422
- NSF-PAR ID:
- 10142316
- Date Published:
- Journal Name:
- Review of Scientific Instruments
- Volume:
- 90
- Issue:
- 3
- ISSN:
- 0034-6748
- Page Range / eLocation ID:
- 033707
- Format(s):
- Medium: X
- Sponsoring Org:
- National Science Foundation