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Title: Accuracy of tip-sample interaction measurements using dynamic atomic force microscopy techniques: Dependence on oscillation amplitude, interaction strength, and tip-sample distance
Award ID(s):
1808422
NSF-PAR ID:
10142316
Author(s) / Creator(s):
;
Date Published:
Journal Name:
Review of Scientific Instruments
Volume:
90
Issue:
3
ISSN:
0034-6748
Page Range / eLocation ID:
033707
Format(s):
Medium: X
Sponsoring Org:
National Science Foundation
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