Standoff detection based on optical spectroscopy is an attractive method for identifying materials at a distance with very high molecular selectivity. Standoff spectroscopy can be exploited in demanding practical applications such as sorting plastics for recycling. Here, we demonstrate selective and sensitive standoff detection of polymer films using bi-material cantilever-based photothermal spectroscopy. We demonstrate that the selectivity of the technique is sufficient to discriminate various polymers. We also demonstrate in situ, point detection of thin layers of polymers deposited on bi-material cantilevers using photothermal spectroscopy. Comparison of the standoff spectra with those obtained by point detection, FTIR, and FTIR-ATR show relative broadening of peaks. Exposure of polymers to UV radiation (365 nm) reveal that the spectral peaks do not change with exposure time, but results in peak broadening with an overall increase in the background cantilever response. The sensitivity of the technique can be further improved by optimizing the thermal sensitivity of the bi-material cantilever and by increasing the number of photons impinging on the cantilever.
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A stepped-sine curve-fit algorithm for finding cantilever resonance shifts in AFM
Atomic force microscopes (AFMs) are used not only to image with nanometer-scale resolution, but also to nanofabricate structures on a surface using methods such as dip-pen nanolithography (DPN). DPN involves using the tip of the AFM to deposit a small amount of material on the surface. Typically, this process is done in open loop, leading to large variations in the amount of material transferred. One of the first steps to closing this loop is to be able to accurately and rapidly measure the amount of deposition. This can be done by measuring the change in the resonance frequency of the cantilever before and after a write as that shift is directly related to the change in mass on the cantilever. Currently, this is done using a thermal-based system identification, a technique which uses the natural Brownian excitation of the cantilever as a white noise excitation combined with a fast Fourier transform to extract a Bode plot. However, thermal-based techniques do not have a good signal to noise ratio at typical cantilever resonance frequencies and thus do not provide the needed resolution in the DPN application. Here we develop a scheme that iteratively uses a stepped-sine approach. At each step of the iteration, three frequencies close to the approximate location of the resonance are injected and used to fit a model of the magnitude of the transfer function. The identified peak is used to select three new frequencies in a smaller range in a binary search to reduce the uncertainty of the measured resonance peak location. The scheme is demonstrated through simulation and shown to produce an accuracy of better than 0.5 Hz on a cantilever with a 14 kHz resonance in a physically realistic noise scenario.
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- Award ID(s):
- 1661412
- NSF-PAR ID:
- 10186131
- Date Published:
- Journal Name:
- 2019 American Control Conference (ACC)
- Page Range / eLocation ID:
- 4368 to 4373
- Format(s):
- Medium: X
- Sponsoring Org:
- National Science Foundation
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- Free Publicly Accessible Full Text
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Accepted Manuscript1.0
- Conference Paper:
- https://doi.org/10.23919/ACC.2019.8814403
