Kumar, Abinash, Baker, Jonathon, Cabral, Matthew, Bowes, Preston, Zhang, Shujun, Dickey, Elizabeth, Irving, Douglas, and LeBeau, James. Complementing X-ray & Neutron Diffuse Scatter Analysis with STEM to Understand Relaxor Behavior. Retrieved from https://par.nsf.gov/biblio/10208968. Microscopy and Microanalysis 26.S2 Web. doi:10.1017/S143192762001483X.

Kumar, Abinash, Baker, Jonathon, Cabral, Matthew, Bowes, Preston, Zhang, Shujun, Dickey, Elizabeth, Irving, Douglas, & LeBeau, James. Complementing X-ray & Neutron Diffuse Scatter Analysis with STEM to Understand Relaxor Behavior. Microscopy and Microanalysis, 26 (S2). Retrieved from https://par.nsf.gov/biblio/10208968. https://doi.org/10.1017/S143192762001483X

Kumar, Abinash, Baker, Jonathon, Cabral, Matthew, Bowes, Preston, Zhang, Shujun, Dickey, Elizabeth, Irving, Douglas, and LeBeau, James. "Complementing X-ray & Neutron Diffuse Scatter Analysis with STEM to Understand Relaxor Behavior". Microscopy and Microanalysis 26 (S2). Country unknown/Code not available. https://doi.org/10.1017/S143192762001483X. https://par.nsf.gov/biblio/10208968.

@article{osti_10208968,
place = {Country unknown/Code not available}, title = {Complementing X-ray & Neutron Diffuse Scatter Analysis with STEM to Understand Relaxor Behavior}, url = {https://par.nsf.gov/biblio/10208968}, DOI = {10.1017/S143192762001483X}, abstractNote = {}, journal = {Microscopy and Microanalysis}, volume = {26}, number = {S2}, author = {Kumar, Abinash and Baker, Jonathon and Cabral, Matthew and Bowes, Preston and Zhang, Shujun and Dickey, Elizabeth and Irving, Douglas and LeBeau, James}, editor = {null} }