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Title: Large Third-Order Nonlinearities in Atomic Layer Deposition Grown Nitrogen-Enriched TiO 2 Nanoscale Films
Nonlinear refractive index, n2 , values as high as 1±.1x10 -9 cm 2 /W were measured in atomic layer deposition (ALD) grown TiO 2 nanoscale films, using femtosecond thermally managed Z-scan. The several order of magnitude increase in n 2 is believed due to the incorporation of nitrogen during growth.  more » « less
Award ID(s):
1905305
PAR ID:
10228715
Author(s) / Creator(s):
; ; ; ; ;
Date Published:
Journal Name:
2020 IEEE Research and Applications of Photonics in Defense Conference, RAPID 2020
Page Range / eLocation ID:
1 to 2
Format(s):
Medium: X
Sponsoring Org:
National Science Foundation
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