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Title: Executing Data Integration Effectively and Efficiently Near the Memory
Award ID(s):
1763503 1739643
NSF-PAR ID:
10283747
Author(s) / Creator(s):
; ;
Date Published:
Journal Name:
IEEE Design & Test
ISSN:
2168-2356
Page Range / eLocation ID:
1 to 1
Format(s):
Medium: X
Sponsoring Org:
National Science Foundation
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