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Title: Spatiospectral characterization of ultrafast pulse-beams by multiplexed broadband ptychography
Ultrafast pulse-beam characterization is critical for diverse scientific and industrial applications from micromachining to generating the highest intensity laser pulses. The four-dimensional structure of a pulse-beam, E ~<#comment/> ( x , y , z , ω<#comment/> ) , can be fully characterized by coupling spatiospectral metrology with spectral phase measurement. When temporal pulse dynamics are not of primary interest, spatiospectral characterization of a pulse-beam provides crucial information even without spectral phase. Here we demonstrate spatiospectral characterization of pulse-beams via multiplexed broadband ptychography. The complex spatial profiles of multiple spectral components, E ~<#comment/> ( x , y , ω<#comment/> ) , from modelocked Ti:sapphire and from extreme ultra-violet pulse-beams are reconstructed with minimum intervening optics and no refocusing. Critically, our technique does not require spectral filters, interferometers, or reference pulses.  more » « less
Award ID(s):
2010359
PAR ID:
10305126
Author(s) / Creator(s):
; ; ; ; ;
Publisher / Repository:
Optical Society of America
Date Published:
Journal Name:
Optics Express
Volume:
29
Issue:
20
ISSN:
1094-4087; OPEXFF
Format(s):
Medium: X Size: Article No. 32474
Size(s):
Article No. 32474
Sponsoring Org:
National Science Foundation
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