Zhang, Yichao, and Flannigan, David J. Imaging Nanometer Phonon Softening at Crystal Surface Steps with 4D Ultrafast Electron Microscopy. Retrieved from https://par.nsf.gov/biblio/10323986. Nano Letters 21.17 Web. doi:10.1021/acs.nanolett.1c02524.
Zhang, Yichao, & Flannigan, David J. Imaging Nanometer Phonon Softening at Crystal Surface Steps with 4D Ultrafast Electron Microscopy. Nano Letters, 21 (17). Retrieved from https://par.nsf.gov/biblio/10323986. https://doi.org/10.1021/acs.nanolett.1c02524
@article{osti_10323986,
place = {Country unknown/Code not available},
title = {Imaging Nanometer Phonon Softening at Crystal Surface Steps with 4D Ultrafast Electron Microscopy},
url = {https://par.nsf.gov/biblio/10323986},
DOI = {10.1021/acs.nanolett.1c02524},
abstractNote = {},
journal = {Nano Letters},
volume = {21},
number = {17},
author = {Zhang, Yichao and Flannigan, David J.},
}
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