Imaging Nanometer Phonon Softening at Crystal Surface Steps with 4D Ultrafast Electron Microscopy (Journal Article) | NSF PAGES

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Citation Details

Imaging Nanometer Phonon Softening at Crystal Surface Steps with 4D Ultrafast Electron Microscopy

Authors:: Zhang, Yichao; Flannigan, David J.

Award ID(s):: 2011401 1654318

Publication Date:: 2021-09-08

NSF-PAR ID:: 10323986

Journal Name:: Nano Letters

Volume:: 21

Issue:: 17

Page Range or eLocation-ID:: 7332 to 7338

ISSN:: 1530-6984

Sponsoring Org:: National Science Foundation

Free Publicly Accessible Full Text
Accepted Manuscript1.0
Publisher's Version of Record
https://doi.org/10.1021/acs.nanolett.1c02524