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Title: Thickness and temperature dependence of the atomic-scale structure of SrRuO 3 thin films
The temperature-dependent layer-resolved structure of 3 to 44 unit cell thick SrRuO 3 (SRO) films grown on Nb-doped SrTiO 3 substrates is investigated using a combination of high-resolution synchrotron x-ray diffraction and high-resolution electron microscopy to understand the role that structural distortions play in suppressing ferromagnetism in ultra-thin SRO films. The oxygen octahedral tilts and rotations and Sr displacements characteristic of the bulk orthorhombic phase are found to be strongly dependent on temperature, the film thickness, and the distance away from the film–substrate interface. For thicknesses, t, above the critical thickness for ferromagnetism ( t > 3 uc), the orthorhombic distortions decrease with increasing temperature above T C . Below T C , the structure of the films remains constant due to the magneto-structural coupling observed in bulk SRO. The orthorhombic distortions are found to be suppressed in the 2–3 interfacial layers due to structural coupling with the SrTiO 3 substrate and correlate with the critical thickness for ferromagnetism in uncapped SRO films.  more » « less
Award ID(s):
1751455
NSF-PAR ID:
10326379
Author(s) / Creator(s):
; ; ; ; ; ; ; ;
Date Published:
Journal Name:
APL Materials
Volume:
10
Issue:
5
ISSN:
2166-532X
Page Range / eLocation ID:
051107
Format(s):
Medium: X
Sponsoring Org:
National Science Foundation
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