Shen, Mingren, Li, Guanzhao, Wu, Dongxia, Yaguchi, Yudai, Haley, Jack C., Field, Kevin G., and Morgan, Dane. A deep learning based automatic defect analysis framework for In-situ TEM ion irradiations. Retrieved from https://par.nsf.gov/biblio/10353529. Computational Materials Science 197.C Web. doi:10.1016/j.commatsci.2021.110560.

Shen, Mingren, Li, Guanzhao, Wu, Dongxia, Yaguchi, Yudai, Haley, Jack C., Field, Kevin G., & Morgan, Dane. A deep learning based automatic defect analysis framework for In-situ TEM ion irradiations. Computational Materials Science, 197 (C). Retrieved from https://par.nsf.gov/biblio/10353529. https://doi.org/10.1016/j.commatsci.2021.110560

Shen, Mingren, Li, Guanzhao, Wu, Dongxia, Yaguchi, Yudai, Haley, Jack C., Field, Kevin G., and Morgan, Dane. "A deep learning based automatic defect analysis framework for In-situ TEM ion irradiations". Computational Materials Science 197 (C). Country unknown/Code not available. https://doi.org/10.1016/j.commatsci.2021.110560. https://par.nsf.gov/biblio/10353529.

@article{osti_10353529,
place = {Country unknown/Code not available}, title = {A deep learning based automatic defect analysis framework for In-situ TEM ion irradiations}, url = {https://par.nsf.gov/biblio/10353529}, DOI = {10.1016/j.commatsci.2021.110560}, abstractNote = {}, journal = {Computational Materials Science}, volume = {197}, number = {C}, author = {Shen, Mingren and Li, Guanzhao and Wu, Dongxia and Yaguchi, Yudai and Haley, Jack C. and Field, Kevin G. and Morgan, Dane}, }