Shen, Mingren, Li, Guanzhao, Wu, Dongxia, Yaguchi, Yudai, Haley, Jack C., Field, Kevin G., and Morgan, Dane. A deep learning based automatic defect analysis framework for In-situ TEM ion irradiations. Retrieved from https://par.nsf.gov/biblio/10353529. Computational Materials Science 197.C Web. doi:10.1016/j.commatsci.2021.110560.
Shen, Mingren, Li, Guanzhao, Wu, Dongxia, Yaguchi, Yudai, Haley, Jack C., Field, Kevin G., & Morgan, Dane. A deep learning based automatic defect analysis framework for In-situ TEM ion irradiations. Computational Materials Science, 197 (C). Retrieved from https://par.nsf.gov/biblio/10353529. https://doi.org/10.1016/j.commatsci.2021.110560
Shen, Mingren, Li, Guanzhao, Wu, Dongxia, Yaguchi, Yudai, Haley, Jack C., Field, Kevin G., and Morgan, Dane.
"A deep learning based automatic defect analysis framework for In-situ TEM ion irradiations". Computational Materials Science 197 (C). Country unknown/Code not available. https://doi.org/10.1016/j.commatsci.2021.110560.https://par.nsf.gov/biblio/10353529.
@article{osti_10353529,
place = {Country unknown/Code not available},
title = {A deep learning based automatic defect analysis framework for In-situ TEM ion irradiations},
url = {https://par.nsf.gov/biblio/10353529},
DOI = {10.1016/j.commatsci.2021.110560},
abstractNote = {},
journal = {Computational Materials Science},
volume = {197},
number = {C},
author = {Shen, Mingren and Li, Guanzhao and Wu, Dongxia and Yaguchi, Yudai and Haley, Jack C. and Field, Kevin G. and Morgan, Dane},
}
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