Shen, Mingren, Li, Guanzhao, Wu, Dongxia, Liu, Yuhan, Greaves, Jacob R.C., Hao, Wei, Krakauer, Nathaniel J., Krudy, Leah, Perez, Jacob, Sreenivasan, Varun, Sanchez, Bryan, Torres-Velázquez, Oigimer, Li, Wei, Field, Kevin G., and Morgan, Dane. Multi defect detection and analysis of electron microscopy images with deep learning. Retrieved from https://par.nsf.gov/biblio/10353536. Computational Materials Science 199.C Web. doi:10.1016/j.commatsci.2021.110576.

Shen, Mingren, Li, Guanzhao, Wu, Dongxia, Liu, Yuhan, Greaves, Jacob R.C., Hao, Wei, Krakauer, Nathaniel J., Krudy, Leah, Perez, Jacob, Sreenivasan, Varun, Sanchez, Bryan, Torres-Velázquez, Oigimer, Li, Wei, Field, Kevin G., & Morgan, Dane. Multi defect detection and analysis of electron microscopy images with deep learning. Computational Materials Science, 199 (C). Retrieved from https://par.nsf.gov/biblio/10353536. https://doi.org/10.1016/j.commatsci.2021.110576

Shen, Mingren, Li, Guanzhao, Wu, Dongxia, Liu, Yuhan, Greaves, Jacob R.C., Hao, Wei, Krakauer, Nathaniel J., Krudy, Leah, Perez, Jacob, Sreenivasan, Varun, Sanchez, Bryan, Torres-Velázquez, Oigimer, Li, Wei, Field, Kevin G., and Morgan, Dane. "Multi defect detection and analysis of electron microscopy images with deep learning". Computational Materials Science 199 (C). Country unknown/Code not available. https://doi.org/10.1016/j.commatsci.2021.110576. https://par.nsf.gov/biblio/10353536.

@article{osti_10353536,
place = {Country unknown/Code not available}, title = {Multi defect detection and analysis of electron microscopy images with deep learning}, url = {https://par.nsf.gov/biblio/10353536}, DOI = {10.1016/j.commatsci.2021.110576}, abstractNote = {}, journal = {Computational Materials Science}, volume = {199}, number = {C}, author = {Shen, Mingren and Li, Guanzhao and Wu, Dongxia and Liu, Yuhan and Greaves, Jacob R.C. and Hao, Wei and Krakauer, Nathaniel J. and Krudy, Leah and Perez, Jacob and Sreenivasan, Varun and Sanchez, Bryan and Torres-Velázquez, Oigimer and Li, Wei and Field, Kevin G. and Morgan, Dane}, }