In this work, we propose LUT-Lock, a novel Look-Up-Table-based netlist obfuscation algorithm, for protecting the intellectual property that is mapped to an FPGA bitstream or an ASIC netlist. We, first, illustrate the effectiveness of several key features that make the LUT-based obfuscation more resilient against SAT attacks and then we embed the proposed key features into our proposed LUT-Lock algorithm. We illustrate that LUT-Lock maximizes the resiliency of the LUT-based obfuscation against SAT attacks by forcing a near exponential increase in the execution time of a SAT solver with respect to the number of obfuscated gates. Hence, by adopting LUT-Lock algorithm, SAT attack execution time could be made unreasonably long by increasing the number of utilized LUTs.
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Silicon validation of LUT-based logic-locked IP cores
Modern semiconductor manufacturing often leverages a fabless model in which design and fabrication are partitioned. This has led to a large body of work attempting to secure designs sent to an untrusted third party through obfuscation methods. On the other hand, efficient de-obfuscation attacks have been proposed, such as Boolean Satisfiability attacks (SAT attacks). However, there is a lack of frameworks to validate the security and functionality of obfuscated designs. Additionally, unconventional obfuscated design flows, which vary from one obfuscation to another, have been key impending factors in realizing logic locking as a mainstream approach for securing designs. In this work, we address these two issues for Lookup Table-based obfuscation. We study both Volatile and Non-volatile versions of LUT-based obfuscation and develop a framework to validate SAT runtime using machine learning. We can achieve unparallel SAT-resiliency using LUT-based obfuscation while incurring 7% area and less than 1% power overheads. Following this, we discuss and implement a validation flow for obfuscated designs. We then fabricate a chip consisting of several benchmark designs and a RISC-V CPU in TSMC 65nm for post functionality validation. We show that the design flow and SAT-runtime validation can easily integrate LUT-based obfuscation into existing CAD tools while adding minimal verification overhead. Finally, we justify SAT-resilient LUT-based obfuscation as a promising candidate for securing designs.
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- Award ID(s):
- 2200446
- NSF-PAR ID:
- 10360798
- Date Published:
- Journal Name:
- DAC '22: Proceedings of the 59th ACM/IEEE Design Automation Conference
- Page Range / eLocation ID:
- 1189 to 1194
- Format(s):
- Medium: X
- Sponsoring Org:
- National Science Foundation
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- Free Publicly Accessible Full Text
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Accepted Manuscript1.0
- Conference Paper:
- https://doi.org/10.1145/3489517.3530606
