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Title: Quantitative Thermal Emission Spectroscopy at High Temperatures: A Laboratory Approach for Measurement and Calibration
Abstract

Acquiring accurate high temperature laboratory‐based infrared emission spectra of geologic samples is important to constrain their radiative and spectral properties. This is important in calculations of lava flow cooling, crust formation, and ultimately lava flow propagation modeling. However, measuring accurate emission at high temperatures remains a challenge. A new micro‐furnace design was created to integrate with a Fourier transform infrared spectrometer, replacing the previous furnace and improving the performance and error metrics. Importantly, this approach accounts for all significant error sources and uses only one spectrometer to acquire sample and calibration emission data over greater temperature (473–1,573 K) and spectral (4,000–500 cm−1, 2.5–20 μm) ranges. Emissivity spectra of forsterite and quartz samples were acquired to test the calibration procedure. Forsterite, with no expected phase transitions over the temperature range, showed spectral change above ∼1140 K, potentially due to amorphization–a process not well described in past studies. The quartz results revealed the expected polymorph transformations at ∼846 and ∼1323 K. A Hawaiian basalt sample served as a representative rock test and showed an increase in emissivity (∼25%) with decreasing temperature. The greatest emissivity increase (∼60%) occurred in the middle infrared region (3,333–2,000 cm−1, 3–5 μm). This is significant for thermal/mass flux calculations using satellite data in this spectral region, which rely on emissivity to derive accurate temperatures. All results are consistent with our previous investigations, but with improved mean accuracy (<2%), uncertainty (<4%), and spectral contrast (<20%). The improved metrics were achieved by constraining the sample measurement geometry, sample temperature stability, and environmental contamination within the experiment.

 
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NSF-PAR ID:
10375376
Author(s) / Creator(s):
 ;  ;  ;  
Publisher / Repository:
DOI PREFIX: 10.1029
Date Published:
Journal Name:
Journal of Geophysical Research: Solid Earth
Volume:
126
Issue:
7
ISSN:
2169-9313
Format(s):
Medium: X
Sponsoring Org:
National Science Foundation
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Fig. 3(b) shows the tunneling probability T according to the Kane two-band model in the three materials, In0.53Ga0.47As, GaAs, and GaN, following our observation of a similar electroluminescence mechanism in GaN/AlN RTDs (due to strong polarization field of wurtzite structures) [8]. The expression is Tinter = (2/9)∙exp[(-2 ∙Ug 2 ∙me)/(2h∙P∙E)], where Ug is the bandgap energy, P is the valence-to-conduction-band momentum matrix element, and E is the electric field. Values for the highest calculated internal E fields for the InGaAs and GaN are also shown, indicating that Tinter in those structures approaches values of ~10-5. As shown, a GaAs RTD would require an internal field of ~6×105 V/cm, which is rarely realized in standard GaAs RTDs, perhaps explaining why there have been few if any reports of room-temperature electroluminescence in the GaAs devices. [1] E.R. Brown,et al., Appl. Phys. Lett., vol. 58, 2291, 1991. [5] S. Sze, Physics of Semiconductor Devices, 2nd Ed. 12.2.1 (Wiley, 1981). [2] M. Feiginov et al., Appl. Phys. Lett., 99, 233506, 2011. [6] L. Coldren, Diode Lasers and Photonic Integrated Circuits, (Wiley, 1995). [3] Y. Nishida et al., Nature Sci. Reports, 9, 18125, 2019. [7] E.O. Kane, J. of Appl. Phy 32, 83 (1961). [4] P. Fakhimi, et al., 2019 DRC Conference Digest. [8] T. Growden, et al., Nature Light: Science & Applications 7, 17150 (2018). [5] S. Sze, Physics of Semiconductor Devices, 2nd Ed. 12.2.1 (Wiley, 1981). [6] L. Coldren, Diode Lasers and Photonic Integrated Circuits, (Wiley, 1995). [7] E.O. Kane, J. of Appl. Phy 32, 83 (1961). [8] T. Growden, et al., Nature Light: Science & Applications 7, 17150 (2018). 
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