skip to main content


Title: Implementation of a null test for freeform optics using a high-definition spatial light modulator

We report the implementation of an interferometric null test using a high-definition spatial light modulator (SLM) as a reconfigurable alternative to a computer-generated hologram. We detail the alignment process chain, including novel techniques using the SLM to project alignment fiducials on the test part. To validate the alignment protocol, we measure a mild off-axis conic with the SLM-based system and cross-validate with conventional interferometry within 30 nm root-mean-square (RMS) surface figure. Finally, we report the null test of a 65 mm clear aperture concave freeform with 91 μm peak-valley sag departure from the base sphere. The measured surface figure of the freeform is within 40 nm RMS compared to the measurement with a commercial metrology instrument.

 
more » « less
Award ID(s):
1822049 1822026
NSF-PAR ID:
10380539
Author(s) / Creator(s):
; ; ;
Publisher / Repository:
Optical Society of America
Date Published:
Journal Name:
Optics Express
Volume:
30
Issue:
24
ISSN:
1094-4087; OPEXFF
Page Range / eLocation ID:
Article No. 43938
Format(s):
Medium: X
Sponsoring Org:
National Science Foundation
More Like this
  1. We report the simulation of an adaptive interferometric null test using a high-definition phase-only spatial light modulator (SLM) to measure form and mid spatial frequencies of a freeform mirror with a sag departure of 150 μm from its base sphere. A state-of-the-art commercial SLM is modeled as a reconfigurable phase computer generated hologram (CGH) that generates a nulling phase function with close to an order of magnitude higher amplitude than deformable mirrors. The theoretical uncertainty in form measurement arising from pixelation and phase quantization of the SLM is 50.62 nm RMS. The calibration requirements for hardware implementation are detailed. © 2019 Optical Society of America https://doi.org/10.1364/OL.44.002000 
    more » « less
  2. Transverse translation-diverse phase retrieval (TTDPR), a ptychographic wavefront-sensing technique, is a viable method for optical surface metrology due to its relatively simple hardware requirements, flexibility, and high demonstrated accuracy in other fields. In TTDPR, a subaperture illumination pattern is scanned across an optic under test, and the reflected intensity is gathered on an array detector near focus. A nonlinear optimization algorithm is used to reconstruct the wavefront aberration at the test surface, from which we can solve for surface error, using intensity patterns from multiple scan positions. TTDPR is an advantageous method for aspheric and freeform metrology, because measurements can be performed without null optics. We report on a sensitivity analysis of TTDPR using simulations of a freeform concave mirror measurement. Simulations were performed to test TTDPR algorithmic performance as a function of various parameters, including detector SNR and position uncertainty of the illumination. 
    more » « less
  3. Precision glass molding is a viable process for the cost-effective volume production of freeform optics. Process development is complex, requiring iterative trials of mold manufacture and metrology, glass mold prototyping, metrology and functional testing. This paper describes the first iteration in the development of a process for an Alvarez lens for visible light. The challenges of this optic are extremely tight band-RMS tolerances on a freeform shape over a maximum clear aperture of 45 mm, a 16:1 aspect ratio and a freeform departure of 329 micrometers. A freeform glass mold for an Alvarez lens was manufactured by coordinated-axis diamond turning in a mold substrate using a custom tool error correction method. The results of prototype precision glass molding are also reported. Mold surfaces and molded optical surfaces are analyzed with scanning white light interferometry. A surface roughness of approximately 3 nm RMS is obtained for both the mold substrate and the glass optic with high-fidelity reproduction of micro-surface structure in the glass. These measurements also identify challenging areas, particularly the presence of mid-spatial frequency errors on the optic originating from the machine thermal control system. The form of the molds was also measured with a profilometer; however, the mold surface does not agree with the expected prescription with an overall deviation in form of approximately 10 μm. The machining process is expected to have sub-micrometer error and the sources of this discrepancy are still being determined. Metrology of the glass optics is currently in progress. 
    more » « less
  4. Multiple wavelength interferometry has long been considered an option for the measurement of large aspheric slope departures. In particular, a synthetic wavelength offers a variety of approaches by which large phase excursions can be unwrapped. Using multiple wavelengths can create collimation and magnification mismatch errors between the individual wavelengths that arise during beam expansion and propagation. Here, we present and analyze alignment and calibration methods for a dual-wavelength interferometer that can significantly reduce both misalignment errors and chromatic aberrations in the system. To correct for misalignment, a general method is described for the alignment of a dual-wavelength interferometer, including the alignment of lasers, beam expanders, beam splitters for combining beams and for compensating errors in the reference surface, and the fringe imaging system. A Fourier transform test at the detector surface was conducted to validate that there is essentially no magnification difference between two wavelengths resulting from misalignment of optical system. For the chromatic aberration introduced by the optical elements in the system, a ray-trace model of the interferometer has been established, to simulate the chromatic effect that optical elements will have on the measurement results. As an experimental test, we examine an off-axis spherical mirror in a non-null condition using a highly aliased interferogram. The above alignment methods and the results are analyzed based on the simulated system errors. Using this method, we demonstrate a measured surface profile of deviation of λ/25 which is comparable to a direct measurement profile of the surface on axis using a Fizeau interferometer. 
    more » « less
  5. We report on the effect of retrace error during measurement of freeform optics using a commercial coherence scanning interferometer (CSI), and its in-built stitching capabilities. It is shown that measuring segments of freeform optics under non-null conditions, results in artifacts on the measured zone, similar to the Seidel aberrations. An experimental approach is used to quantify the induced aberrations based on the local slopes of the surface. Simulation of surfaces containing different order aberrations is shown to have a significant effect on the measurement data. A correction method is proposed that uses experimental measurements to determine the required correction based on local slope and position in the aperture. These corrections reduce the measurement difference from a comparison measurement using a Fizeau interferometer.

     
    more » « less