Holland, Steffen, Rauchel, Simon, Notermans, Guido, Xu, Yang, Shen, Li, Beetner, Daryl, and Pommerenke, David. Determining the Peak Voltage during TVS switching at the I/O of an IC using Component Measurement Data. Retrieved from https://par.nsf.gov/biblio/10393110. 2022 44th Annual EOS/ESD Symposium (EOS/ESD) . Web. doi:10.23919/EOS/ESD54763.2022.9928462.

Holland, Steffen, Rauchel, Simon, Notermans, Guido, Xu, Yang, Shen, Li, Beetner, Daryl, & Pommerenke, David. Determining the Peak Voltage during TVS switching at the I/O of an IC using Component Measurement Data. 2022 44th Annual EOS/ESD Symposium (EOS/ESD), (). Retrieved from https://par.nsf.gov/biblio/10393110. https://doi.org/10.23919/EOS/ESD54763.2022.9928462

Holland, Steffen, Rauchel, Simon, Notermans, Guido, Xu, Yang, Shen, Li, Beetner, Daryl, and Pommerenke, David. "Determining the Peak Voltage during TVS switching at the I/O of an IC using Component Measurement Data". 2022 44th Annual EOS/ESD Symposium (EOS/ESD) (). Country unknown/Code not available. https://doi.org/10.23919/EOS/ESD54763.2022.9928462. https://par.nsf.gov/biblio/10393110.

@article{osti_10393110,
place = {Country unknown/Code not available}, title = {Determining the Peak Voltage during TVS switching at the I/O of an IC using Component Measurement Data}, url = {https://par.nsf.gov/biblio/10393110}, DOI = {10.23919/EOS/ESD54763.2022.9928462}, abstractNote = {}, journal = {2022 44th Annual EOS/ESD Symposium (EOS/ESD)}, author = {Holland, Steffen and Rauchel, Simon and Notermans, Guido and Xu, Yang and Shen, Li and Beetner, Daryl and Pommerenke, David}, }