The transferability of adversarial examples is of central importance to transfer-based black-box adversarial attacks. Previous works for generating transferable adversarial examples focus on attacking given pretrained surrogate models while the connections between surrogate models and adversarial trasferability have been overlooked. In this paper, we propose Lipschitz Regularized Surrogate (LRS) for transfer-based black-box attacks, a novel approach that transforms surrogate models towards favorable adversarial transferability. Using such transformed surrogate models, any existing transfer-based black-box attack can run without any change, yet achieving much better performance. Specifically, we impose Lipschitz regularization on the loss landscape of surrogate models to enable a smoother and more controlled optimization process for generating more transferable adversarial examples. In addition, this paper also sheds light on the connection between the inner properties of surrogate models and adversarial transferability, where three factors are identified: smaller local Lipschitz constant, smoother loss landscape, and stronger adversarial robustness. We evaluate our proposed LRS approach by attacking state-of-the-art standard deep neural networks and defense models. The results demonstrate significant improvement on the attack success rates and transferability. Our code is available at https://github.com/TrustAIoT/LRS. 
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                            Robustify ML-Based Lithography Hotspot Detectors
                        
                    
    
            Deep learning has been widely applied in various VLSI design automation tasks, from layout quality estimation to design optimization. Though deep learning has shown state-of-the-art performance in several applications, recent studies reveal that deep neural networks exhibit intrinsic vulnerability to adversarial perturbations, which pose risks in the ML-aided VLSI design flow. One of the most effective strategies to improve robustness is regularization approaches, which adjust the optimization objective to make the deep neural network generalize better. In this paper, we examine several adversarial defense methods to improve the robustness of ML-based lithography hotspot detectors. We present an innovative design rule checking (DRC)-guided curvature regularization (CURE) approach, which is customized to robustify ML-based lithography hotspot detectors against white-box attacks. Our approach allows for improvements in both the robustness and the accuracy of the model. Experiments show that the model optimized by DRC-guided CURE achieves the highest robustness and accuracy compared with those trained using the baseline defense methods. Compared with the vanilla model, DRC-guided CURE decreases the average attack success rate by 53.9% and increases the average ROC-AUC by 12.1%. Compared with the best of the defense baselines, DRC-guided CURE reduces the average attack success rate by 18.6% and improves the average ROC-AUC by 4.3%. 
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                            - Award ID(s):
- 2106828
- PAR ID:
- 10435301
- Date Published:
- Journal Name:
- 2022 IEEE/ACM International Conference On Computer Aided Design (ICCAD)
- Page Range / eLocation ID:
- 1 to 7
- Format(s):
- Medium: X
- Sponsoring Org:
- National Science Foundation
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