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ABSTRACT The physical aging behavior, time‐dependent densification, of thin polystyrene (PS) films supported on silicon are investigated using ellipsometry for a large range of molecular weights (MWs) fromMw = 97 to 10,100 kg mol−1. We report an unexpected MW dependence to the physical aging rate ofh < 80‐nm thick films not present in bulk films, where samples made from ultra‐high MWs ≥ 6500 kg mol−1exhibit on average a 45% faster aging response at an aging temperature of 40 °C compared with equivalent films made from (merely) high MWs ≤ 3500 kg mol−1. This MW‐dependent difference in physical aging response indicates that the breadth of the gradient in dynamics originating from the free surface in these thin films is diminished for films of ultra‐high MW PS. In contrast, measures of the film‐average glass transition temperatureTg(h) and effective average film density (molecular packing) show no corresponding change for the same range of film thicknesses, suggesting physical aging may be more sensitive to differences in dynamical gradients. These results contribute to growing literature reports signaling that chain connectivity and entropy play a subtle, but important role in how glassy dynamics are propagated from interfaces. © 2019 Wiley Periodicals, Inc. J. Polym. Sci., Part B: Polym. Phys.2019,57, 1224–1238
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Quantitative Image Analysis of Fractal‐Like Thin Films of Organic Semiconductors
ABSTRACT Morphology modulation offers significant control over organic electronic device performance. However, morphology quantification has been rarely carried outviaimage analysis. In this work, we designed a MATLAB program to evaluate two key parameters describing morphology of small molecule semiconductor thin films: fractal dimension and film coverage. We then use this program in a case study of meniscus‐guided coating of 2,7‐dioctyl[1]benzothieno[3,2‐b][1]benzothiophene (C8‐BTBT) under various conditions to analyze a diverse and complex morphology set. The evolution of morphology in terms of fractal dimension and film coverage was studied as a function of coating speed. We discovered that combined fractal dimension and film coverage can quantitatively capture the key characteristics of C8‐BTBT thin film morphology; change of these two parameters further inform morphology transition. Furthermore, fractal dimension could potentially shed light on thin film growth mechanisms. © 2019 Wiley Periodicals, Inc. J. Polym. Sci., Part B: Polym. Phys.2019, 57, 1622–1634
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- Award ID(s):
- 1847828
- PAR ID:
- 10459785
- Publisher / Repository:
- Wiley Blackwell (John Wiley & Sons)
- Date Published:
- Journal Name:
- Journal of Polymer Science Part B: Polymer Physics
- Volume:
- 57
- Issue:
- 23
- ISSN:
- 0887-6266
- Page Range / eLocation ID:
- p. 1622-1634
- Format(s):
- Medium: X
- Sponsoring Org:
- National Science Foundation
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