Bogdanović; Iva; Lorenz, Katharina
(Ed.)
PIXE analysis was conducted on p8 fisher brand filter paper samples soaked in elemental standard solutions to determine the minimum detectable levels of Al, Si, P, S, Cl, K, Ca, Cr, Fe, Ni, Cu, and Se. All samples were analyzed with beam parameters of 2 µC incident charge, and beam current of less than 2 nA at 2 MeV beam energy. Minimum detectable levels were obtained by analyzing the x-ray spectrum in the GeoPIXE analysis package, and the data for each element would be averaged over all collected spectra. The minimum detectable level in parts per million was found to be on average 9.59 for Al, 4.6 for Si, 3.23 for P, 2.27 for S, 1.82 for Cl, 1.15 for K, 0.88 for Ca, 0.51 for Cr, 0.07 for Mn, 0.54 for Fe, 1.59 for Ni, 2.0 for Zn, 1.55 for Cu, and 6.5 for Se. Minimal deviation from the averaged values was observed, except in cases where samples contained high concentrations of elements with overlapping X-ray energies.
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