Abstract The process uncertainty induced quality issue remains the major challenge that hinders the wider adoption of additive manufacturing (AM) technology. The defects occurred significantly compromise structural integrity and mechanical properties of fabricated parts. Therefore, there is an urgent need in fast, yet reliable AM component certification. Most finite element analysis related methods characterize defects based on the thermomechanical relationships, which are computationally inefficient and cannot capture process uncertainty. In addition, there is a growing trend in data-driven approaches on characterizing the empirical relationships between thermal history and anomaly occurrences, which focus on modeling an individual image basis to identify local defects. Despite their effectiveness in local anomaly detection, these methods are quite cumbersome when applied to layer-wise anomaly detection. This paper proposes a novel in situ layer-wise anomaly detection method by analyzing the layer-by-layer morphological dynamics of melt pools and heat affected zones (HAZs). Specifically, the thermal images are first preprocessed based on the g-code to assure unified orientation. Subsequently, the melt pool and HAZ are segmented, and the global and morphological transition metrics are developed to characterize the morphological dynamics. New layer-wise features are extracted, and supervised machine learning methods are applied for layer-wise anomaly detection. The proposed method is validated using the directed energy deposition (DED) process, which demonstrates superior performance comparing with the benchmark methods. The average computational time is significantly shorter than the average build time, enabling in situ layer-wise certification and real-time process control. 
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                            Personalized feature extraction for manufacturing process signature characterization and anomaly detection
                        
                    
    
            Manufacturing process signatures reflect the process stability and anomalies that potentially lead to detrimental effects on the manufactured outcomes. Sensing technologies, especially in-situ image sensors, are widely used to capture process signatures for diagnostics and prognostics. This imaging data is crucial evidence for process signature characterization and monitoring. A critical aspect of process signature analysis is identifying the unique patterns in an image that differ from the generic behavior of the manufacturing process in order to detect anomalies. It is equivalent to separating the “unique features” and process-wise (or phase-wise) “shared features” from the same image and recognizing the transient anomaly, i.e., recognizing the outlier “unique features”. In state-of-the-art literature, image-based process signature analysis relies on conventional feature extraction procedures, which limit the “view” of information to each image and cannot decouple the shared and unique features. Consequently, the features extracted are less interpretable, and the anomaly detection method cannot distinguish the abnormality in the current process signature from the process-wise evolution. Targeting this limitation, this study proposes personalized feature extraction (PFE) to decouple process-wise shared features and transient unique features from a sensor image and further develops process signature characterization and anomaly detection strategies. The PFE algorithm is designed for heterogeneous data with shared features. Supervised and unsupervised anomaly detection strategies are developed upon PFE features to remove the shared features from a process signature and examine the unique features for abnormality. The proposed method is demonstrated on two datasets (i) selected data from the 2018 AM Benchmark Test Series from the National Institute of Standards and Technology (NIST), and (ii) thermal measurements in additive manufacturing of a thin-walled structure of Ti–6Al–4V. The results highlight the power of personalized modeling in extracting features from manufacturing imaging data. 
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                            - Award ID(s):
- 2144147
- PAR ID:
- 10502295
- Publisher / Repository:
- ScienceDirect
- Date Published:
- Journal Name:
- Journal of Manufacturing Systems
- Volume:
- 74
- Issue:
- C
- ISSN:
- 0278-6125
- Page Range / eLocation ID:
- 435 to 448
- Format(s):
- Medium: X
- Sponsoring Org:
- National Science Foundation
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