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Abstract The surface topography of diamond coatings strongly affects surface properties such as adhesion, friction, wear, and biocompatibility. However, the understanding of multi-scale topography, and its effect on properties, has been hindered by conventional measurement methods, which capture only a single length scale. Here, four different polycrystalline diamond coatings are characterized using transmission electron microscopy to assess the roughness down to the sub-nanometer scale. Then these measurements are combined, using the power spectral density (PSD), with conventional methods (stylus profilometry and atomic force microscopy) to characterize all scales of topography. The results demonstrate the critical importance of measuring topography across all length scales, especially because their PSDs cross over one another, such that a surface that is rougher at a larger scale may be smoother at a smaller scale and vice versa. Furthermore, these measurements reveal the connection between multi-scale topography and grain size, with characteristic scaling behavior at and slightly below the mean grain size, and self-affine fractal-like roughness at other length scales. At small (subgrain) scales, unpolished surfaces exhibit a common form of residual roughness that is self-affine in nature but difficult to detect with conventional methods. This approach of capturing topography from the atomic- to the macro-scale is termedcomprehensive topography characterization, and all of the topography data from these surfaces has been made available for further analysis by experimentalists and theoreticians. Scientifically, this investigation has identified four characteristic regions of topography scaling in polycrystalline diamond materials.
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Evaluating scanning electron microscopy for the measurement of small-scale topography
Abstract For predicting surface performance, multiscale topography analysis consistently outperforms standard roughness metrics; however, surface-characterization tools limit the range of sizes that can be measured. Therefore, we evaluate the use of scanning electron microscopy (SEM) to systematically measure small-scale topography. While others have employed SEM for similar purposes, the novelty of this investigation lies in the development and validation of a simple, flexible procedure that can be applied to a wide range of materials and geometries. First, we established four different options that can be used for sample preparation, and we measured quantitative topography of each using the SEM. Then the power spectral density (PSD) was used to compare topography among the four preparations, and against other techniques. A statistical comparison of PSDs demonstrated that SEM topography measurements outperformed AFM measurements at scales below 100 nm and were statistically indistinguishable from (highly labor-intensive) TEM measurements down to 16 nm. The limitations of SEM-based topography are quantified and discussed. Overall, the results show a simple generalizable method for revealing small-scale topography. When combined with traditional stylus profilometry, this technique characterizes surface topography across almost seven orders of magnitude, from 1 cm down to 16 nm, facilitating the use of physical models to predict performance.
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- Award ID(s):
- 1844739
- PAR ID:
- 10507946
- Publisher / Repository:
- IOP
- Date Published:
- Journal Name:
- Surface Topography: Metrology and Properties
- ISSN:
- 2051-672X
- Format(s):
- Medium: X
- Sponsoring Org:
- National Science Foundation
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Accepted Manuscript1.0
- Journal Article:
- https://doi.org/10.1088/2051-672X/ad49b9
